Resistor Delay-Line TDC for High Resolution With Lower Chip Area

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Solution Overview

Problem

Conventional time-to-digital converters (TDCs) face challenges in achieving high resolution while maintaining a small chip size and reducing power consumption, particularly in implementing high-frequency all-digital phase locked loops, as they require larger chip sizes and increased power consumption.

Innovation Solution

A high-resolution TDC design incorporating two delay lines with resistors and comparators, along with an encoder, where the resistors are implemented using metal lines and via plugs to achieve small resistance values, and includes resolution control capacitor banks and delay time compensation units to optimize resolution and power efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a vernier delay line is used to increase resolution, then measurement precision is improved, but area of stationary object increases

Engineering Contradiction:
ImproveresolutionVSAvoidchip size
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The delay line is segmented into multiple sections with different delay characteristics. By dividing the delay line into segments and selectively activating them, the patent achieves high resolution without requiring a complete vernier delay line structure, thereby reducing chip area while maintaining measurement precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The delay elements are designed to serve multiple functions: they provide both delay functionality and resolution measurement capability. This multi-functionality eliminates the need for separate vernier delay lines, reducing overall chip area while maintaining high resolution performance.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If a vernier delay line is used to increase resolution, then measurement precision is improved, but power consumption increases

Engineering Contradiction:
ImproveresolutionVSAvoidpower consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent implements dynamic control of delay line sections, activating only the necessary segments for each measurement. This dynamic operation reduces overall power consumption compared to continuously operating complete vernier delay lines, while maintaining high resolution through selective section activation.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Instead of utilizing the full vernier delay line structure for all measurements, the patent employs partial action by activating only the minimum necessary delay sections required for achieving the desired resolution, thereby significantly reducing power consumption while maintaining measurement precision.

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If a vernier delay line is used to increase resolution, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
ImproveresolutionVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts and removes unnecessary components from the traditional vernier delay line structure, retaining only the essential elements required for high-resolution measurement. This extraction simplifies the overall device complexity while preserving the core functionality that enables precise time difference measurement.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of following the conventional vernier delay line approach with two complete delay lines, the patent inverts the methodology by using a single delay line with selectively activated sections. This inverted approach achieves the same resolution with reduced structural complexity.

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentUS7501973B2High-resolution time-to-digital converter
Publication Date: 2009.03.10 SAMSUNG ELECTRONICS CO LTD
  • US7501973B2 patent drawing
  • US7501973B2 patent drawing
  • US7501973B2 patent drawing

AI summary

A time-to-digital converter includes a first delay line, a second delay line, comparators, and an encoder. The first delay line includes first resistors coupled in series and receives a first signal through a start node. The second delay line includes second resistors coupled in series and receives a second signal through a node corresponding to an end node of the first delay line. The comparators compare first voltages of nodes on the first delay line with second voltages of corresponding nodes on the second delay line. The encoder generates a digital code based on outputs of the comparators. Therefore, the time-to-digital converter may decrease a chip size thereof and lower power consumption, and the time-to-digital converter may increase a range of a maximum delay time between two signals.