RF Aperture Phase Correction via Optical Metrology

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Solution Overview

Problem

Current methods for measuring and characterizing celestial bodies, particularly moving ones, face significant challenges due to extraterrestrial conditions such as distance, lack of gravity, light distortion, and orbits, which hinder accurate measurement and surface characterization of radio frequency structures.

Innovation Solution

The implementation of an optical metrology system that utilizes an Optical Frequency Domain Reflectometer (OFDR) for real-time shape characterization of aperture deformation, enabling phase correction of antenna arrays, and employing multilateration and numerical estimation for high-fidelity static and dynamic structure characterization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional laser range finders measure range to one optical metric marker at a time, then measurement simplicity is maintained, but measurement time and productivity decrease when measuring multiple markers

Engineering Contradiction:
Improvemeasurement speedVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent divides the measurement task into parallel independent measurements by using multiple optical metric markers positioned at different locations on the RF aperture structure. Each marker can be measured simultaneously by the OFDR system, enabling parallel processing of measurement data and significantly improving productivity without requiring complex multi-sensor arrays.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from sequential one-dimensional measurement (one marker at a time) to simultaneous multi-point measurement by distributing optical metric markers across the three-dimensional space of the RF aperture. This spatial distribution enables the system to characterize the entire aperture structure in a single measurement cycle, dramatically improving measurement speed.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If optical metric markers are placed sparsely on the RF aperture structure, then device complexity is reduced, but measurement precision and manufacturing precision of the aperture shape decrease

Engineering Contradiction:
Improveaperture shape characterization accuracyVSAvoidnumber of optical metric markers
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies optical metric markers strategically at specific critical locations on the RF aperture structure where shape deformation is most significant, rather than uniformly distributing them. This localized approach ensures high measurement precision at key positions while minimizing the total number of markers required, thus maintaining low device complexity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses optical metric markers as proxy representations of the actual RF aperture structure. These markers serve as measurable copies that capture the essential shape and deformation characteristics of the aperture without requiring direct measurement of the aperture itself, enabling high precision characterization with minimal markers.

Inventive Principle:
Principle #26Copying

3Reliability

If real-time shape characterization is implemented for aperture deformation, then signal transmission quality improves through phase correction, but use of energy increases due to continuous monitoring and computation

Engineering Contradiction:
Improvesignal transmission qualityVSAvoidenergy consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent implements continuous real-time monitoring of aperture shape using the OFDR system, enabling ongoing phase correction of the RF aperture. This continuous action ensures maintained signal transmission quality by constantly compensating for deformation, though it does increase energy consumption compared to periodic or static measurement approaches.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The patent establishes a feedback loop where the OFDR system continuously measures aperture shape, the estimator algorithm processes this data to determine phase corrections, and the RF aperture is adjusted accordingly. This closed-loop feedback mechanism ensures reliable signal transmission by continuously compensating for deformation, with energy consumption justified by the maintained transmission quality.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables dynamic characterization and adjustment of radio frequency apertures and transmission structures, improving the accuracy and efficiency of signal transmission and surface monitoring, even in challenging extraterrestrial environments.

Implementation Method 1

The present disclosure comprises a form of laser distance measurement using optical interference comparison ideal for high-resolution strain measurements

Methodology Applied
Scientific EffectOptical interference: Interference

Implementation Method 2

Traditional laser range finders measure range to one optical metric marker at a time

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS12320907B2Systems and methods for dynamic characterization and adjustment of radio frequency aperture and transmission
Publication Date: 2025.06.03 REDWIRE HLDG LLC
  • US12320907B2 patent drawing
  • US12320907B2 patent drawing
  • US12320907B2 patent drawing

AI summary

The present disclosure provides for systems and methods for quasi-static and dynamic characterization and adjustment of radio frequency aperture and transmission. The system may comprise a transmission structure with a plurality of sensors and a plurality of optical metric markers. The system may send information from an estimator to one or more controllers via corrective signals. The method may comprise conversion of distance measurements received from a plurality of sensors to plot cartesian coordinates in three-dimensional space as a function of time. The computation module may comprise multilateration or trilateration and the estimator. When the system comprises one or more controllers, the controllers may be actuated in response to optical information received from the plurality of optical metric markers. The estimator may provide knowledge needed for phase correction of large array from sparse data that is then translated to controller actuation.