RF Emission Analysis Apparatus for Device Susceptibility Testing
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Solution Overview
Problem
Current methods are inadequate for assessing the effects of RF illumination on electronic devices, as they fail to test all possible combinations of frequencies, amplitudes, modulation waveforms, and spatial distributions of interfering signals, leading to incomplete understanding of device susceptibility and impact.
Innovation Solution
An apparatus and method that use antennas, a receiver, and a controller with processors to iteratively control RF illumination parameters, measuring changes in electromagnetic emissions and assigning score values to optimize parameters such as pulse frequency, amplitude, and duty cycle to determine the state and operation of electronic devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If current RF illumination methods are used to test all possible combinations of frequencies, amplitudes, modulation waveforms, and spatial distributions, then complete understanding of device susceptibility is achieved, but the complexity and time required for testing becomes unmanageable
Solution Approach 1:
The system employs feedback mechanisms where the receiver continuously monitors unintended emissions from the device under test, and the controller uses this feedback information to iteratively adjust illumination parameters. This closed-loop approach allows the system to focus testing on parameter combinations that actually affect device operation, rather than exhaustively testing all possible combinations, thereby reducing complexity while maintaining assessment completeness.
Solution Approach 2:
The illumination parameters (frequency, amplitude, modulation waveform, spatial distribution) are dynamically adjusted during the testing process based on real-time measurements of device emissions and operation state. This dynamic adaptation allows the system to efficiently navigate the parameter space by concentrating resources on critical regions, avoiding the need for static, exhaustive testing of all parameter combinations.
2Measurement precision
If exhaustive testing of all RF parameter combinations is performed, then complete device susceptibility assessment is achieved, but the time required for testing becomes prohibitively long
Solution Approach 1:
The feedback loop enables rapid iteration by using real-time measurement results to guide subsequent testing parameters. The controller adjusts illumination parameters based on observed device responses, allowing the system to quickly converge on critical susceptibility conditions without wasting time testing non-critical parameter combinations that would be included in an exhaustive approach.
Solution Approach 2:
The system performs preliminary characterization of device emissions to identify key frequency components and operational modes before conducting full susceptibility testing. This preliminary action allows subsequent testing to be focused on relevant parameter ranges, significantly reducing the overall testing time while maintaining completeness of assessment.
3Measurement precision
If high power RF illumination is used to ensure detection of all device responses, then detection sensitivity is improved, but the risk of damaging the device under test increases
Solution Approach 1:
The illumination power is dynamically adjusted during testing based on real-time measurements of device emissions and operational state. The system starts with lower power levels and increases only when necessary to detect specific responses, thereby maintaining detection sensitivity while minimizing the risk of device damage from excessive RF exposure.
Solution Approach 2:
Instead of using consistently high power illumination, the system varies multiple parameters including frequency, amplitude, modulation waveform, and temporal characteristics. This parameter diversity allows the system to achieve detection sensitivity through parameter optimization rather than relying solely on high power, thereby reducing device stress and damage risk.
4Measurement precision
If detailed monitoring of electromagnetic emissions is performed to assess device state, then assessment accuracy is improved, but the complexity of the monitoring system increases
Solution Approach 1:
The monitoring system is designed to perform multiple functions using a unified approach: it characterizes device emissions, identifies operational states, detects susceptibility effects, and provides feedback for parameter optimization. This multi-functionality is achieved through a integrated controller that processes emission data across multiple dimensions (frequency, time, amplitude) to derive comprehensive device state information, avoiding the need for separate specialized systems for each function.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for a detailed and efficient assessment of RF effects on electronic devices, identifying optimal parameters to achieve desired states, from temporary disruption to permanent disablement, with minimal power and precision, thereby improving monitoring and assessment capabilities.
Implementation Method 1
a receiver coupled to the one or more antennas and operable to receive emission(s) of electromagnetic energy from the device
Implementation Method 2
an illumination device coupled to the one or more antennas so as to illuminate the device with a pulse of electromagnetic energy
Data Source
AI summary
An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the electrical device.