RF IC Test Prepared Frequency Divider Substitution
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Solution Overview
Problem
The testing of integrated circuits with RF circuits is hindered by the lack of widely available specialized RF testing equipment, making it costly and inefficient to manufacture and test these circuits.
Innovation Solution
A test prepared integrated circuit is designed with a test control input that enables the substitution of a local oscillator signal with a divided-down frequency during testing, utilizing a frequency divider circuit and multiplexer to facilitate testing without requiring special RF testing equipment, thereby allowing lower frequency signals to be used for testing RF circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If specialized RF testing equipment is used to test RF circuit components, then testing accuracy and capability are improved, but equipment cost and complexity increase
Solution Approach 1:
The patent introduces a frequency divider circuit as an intermediary component that converts high-frequency RF signals to lower test frequencies. This mediator allows conventional low-frequency test equipment to effectively test RF circuits by translating the frequency domain, thereby avoiding the need for expensive specialized RF testing equipment while maintaining testing capability.
Solution Approach 2:
The invention changes the frequency parameter of the test signal by using a frequency divider circuit that divides the RF local oscillator frequency by a factor N. This parameter transformation enables standard test equipment operating at lower frequencies to test RF circuits that normally require high-frequency equipment, thus reducing equipment complexity and cost.
2Measurement precision
If RF testing is performed at original high frequencies, then accurate RF performance measurement is achieved, but equipment availability and cost-effectiveness worsen
Solution Approach 1:
The patent applies frequency division to transform the measurement parameter from high RF frequency to lower test frequency. The frequency divider circuit divides the local oscillator frequency by N, allowing conventional test equipment to measure RF circuit performance indirectly through the divided frequency signal, thereby improving cost-effectiveness while maintaining measurement validity.
Solution Approach 2:
The invention creates a frequency-scaled copy of the RF signal through the frequency divider circuit. Instead of directly testing at the original RF frequency, the system tests a divided-frequency copy that contains the same circuit functionality information, enabling use of standard equipment for RF circuit testing.
3Adaptability or versatility
If frequency divider circuit is added for test signal substitution, then testing capability with conventional equipment is improved, but circuit complexity and test setup requirements increase
Solution Approach 1:
The frequency divider circuit is designed to serve dual purposes: it functions as part of the normal RF signal generation during operation and as a test signal generator when activated in test mode. This multi-functionality reduces the need for separate dedicated test components, thereby limiting the increase in overall circuit complexity while improving testing versatility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the effective testing of RF circuit components using conventional test signal generators, reducing the need for specialized equipment and minimizing disturbance to phase relationships, thus enabling efficient and cost-effective testing of RF integrated circuits.
Implementation Method 1
a frequency divider circuit that divides a frequency of a signal from the local oscillator circuit by a factor N to produce a divided signal with a frequency that is lower than the frequency of the signal from the local oscillator circuit
Data Source
AI summary
In an example embodiment, an integrated circuit comprises a mixer circuit and a local oscillator circuit. During testing a frequency divider circuit in the integrated circuit divides a local oscillator signal to a frequency below a normal operating range of the local oscillator. The integrated circuit applies the divided local oscillator signal to the mixer circuit instead of the local oscillator signal during testing. Signal properties of a signal derived from the mixer circuit are measured while the divided local oscillator signal is applied to the mixer circuit.