RF IC Test Loop for Phase Shifter Defect Screening
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Solution Overview
Problem
Existing methods for testing RF integrated circuits, particularly those supporting millimeter-wave communication, face challenges in efficiently evaluating phase shifters during mass production due to the high cost and specialized nature of vector network analyzers, making it difficult to implement effective defect testing in a mass-production environment.
Innovation Solution
A method involving a test loop that passes through transceiver and front-end circuits, allowing for the adjustment of phase shifter settings and evaluation of characteristics using a test input signal, enabling the determination of phase shifter defects with existing test devices, thereby facilitating mass production of RF integrated circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a vector network analyzer is used to test phase shifters in RF integrated circuits, then measurement precision is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent creates a virtual model of the phase shifter's electrical characteristics through software simulation and signal processing algorithms. Instead of using expensive physical vector network analyzers, the system uses a simplified test device combined with digital signal processing to replicate the measurement capabilities, thereby reducing hardware complexity while maintaining measurement precision
Solution Approach 2:
The patent replaces the mechanical/electrical measurement system (vector network analyzer) with an information-processing system. By using signal generation, transmission through the device under test, and digital analysis of the output signal, the system substitutes complex physical measurement equipment with a combination of simpler electronic components and software algorithms
2Measurement precision
If a vector network analyzer is used for phase shifter testing, then measurement capability is improved, but ease of manufacture deteriorates due to high cost and specialized requirements
Solution Approach 1:
The patent employs inexpensive test devices that can be easily manufactured and deployed for mass production testing. Rather than requiring expensive, specialized vector network analyzers, the system uses affordable signal generators and receivers combined with digital processing, making the testing process economically viable for high-volume manufacturing
Solution Approach 2:
The patent designs a universal test system that can evaluate multiple types of RF integrated circuits and phase shifters using the same hardware platform. The software-configurable nature of the system allows it to adapt to different testing requirements, eliminating the need for specialized equipment for each device type and simplifying mass production testing
3Ease of manufacture
If existing test devices are used for RF integrated circuit testing, then ease of manufacture is improved, but measurement precision deteriorates due to inability to test phase shifters
Solution Approach 1:
The patent enhances the capabilities of existing test devices by changing the parameters and configuration of the testing system. By adjusting frequency ranges, signal processing algorithms, and test methodologies, the system enables precise phase shifter measurements using equipment originally designed for simpler magnitude-based testing of low-frequency circuits
Data Source
AI summary
A method of testing a radio frequency (RF) integrated circuit includes: forming, performed by the RF integrated circuit, a test loop that passes through a first transceiver circuit, a first front-end circuit, and a second transceiver circuit, based on a test control signal transmitted from a test device; adjusting, performed by the RF integrated circuit, a shift degree of at least one phase shifter in the first front-end circuit, based on the test control circuit; and receiving, performed by the RF integrated circuit, a test input signal via the first transceiver circuit from the test device, and outputting, to the test device, the test input signal that has passed through the test loop, wherein the test input signal is output as a test output signal via the second transceiver circuit.