RF Jitter Testing Using Reference Device
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Solution Overview
Problem
Conventional automatic test equipment (ATE) lacks the capability to simultaneously test signal integrity and jitter for high-frequency components, such as those operating at 60 GHz, often requiring up/down converters and modulated signal sources, which increases costs and calibration needs, and typically requires multiple insertions, slowing down the testing process.
Innovation Solution
A tester and method using a reference device to transmit and receive electromagnetic RF signals with a test data pattern, allowing for simultaneous testing of RF performance and jitter in a single insertion, eliminating the need for up/down converters and reducing calibration and maintenance costs, while increasing testing speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional ATE is used to test RF performance and jitter simultaneously, then testing capability is improved, but device complexity and cost increase due to requiring up/down converters and modulated signal sources
Solution Approach 1:
The patent combines RF performance testing and jitter testing into a single integrated test system. The ATE is configured to perform both types of tests simultaneously using a single signal source and baseband interface, eliminating the need for separate up/down converters and modulated signal sources that would otherwise be required for each test type.
Solution Approach 2:
The test system is designed with multi-functionality to handle both RF performance and jitter testing through a unified architecture. The baseband signal interface and signal generation capabilities are configured to support multiple test types without requiring dedicated hardware for each function, thereby reducing overall system complexity while maintaining versatile testing capability.
2Measurement precision
If conventional ATE requires multiple insertions for testing, then measurement precision is improved, but productivity decreases due to slower testing process
Solution Approach 1:
The patent enables continuous testing by performing both RF performance and jitter measurements in a single device insertion. The test system continuously acquires signals and performs multiple measurements without requiring the device to be removed and re-inserted, thereby maintaining measurement precision while significantly improving testing speed and productivity.
3Adaptability or versatility
If conventional ATE uses up/down converters for high frequency testing, then frequency range is extended, but ease of operation deteriorates due to increased calibration needs
Solution Approach 1:
The patent extracts and eliminates the up/down converter components from the test system architecture. By using a baseband signal interface that可以直接 generate and process high-frequency signals, the system extends its frequency range capability while removing the calibration-intensive converter stages, thereby significantly reducing calibration needs and improving ease of operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient testing of communication modules at extremely high frequencies by using a reference device to perform both RF performance and jitter tests in a single insertion, reducing costs and improving testing speed compared to traditional methods.
Implementation Method 1
transmitting, via the reference device, a transmitted electromagnetic RF signal to the DUT, the transmitted electromagnetic RF signal including a test data pattern, and receiving, via the reference device, a received electromagnetic RF signal emitted from the DUT
Data Source
AI summary
According to some embodiments, a tester tests one or more DUTs by utilizing one or more respective reference devices. The tester comprises one or more test sites and one or more test circuits operatively coupled to each of the test sites. Each test site is configured to: hold a reference device and a DUT, transmit a transmitted electromagnetic RF signal including a test data pattern to the DUT, and receive a received electromagnetic RF signal emitted from the DUT. The test circuits are configured to: receive a first electrical signal converted from the received electromagnetic RF signal, extract first data from the first electrical signal, determine a first error rate between the test data pattern and the first data, and generate a test result on the basis of the first error rate.