RF Power Transistor Package Substrate for Shorter Bond Wires

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Solution Overview

Problem

Conventional base substrates for RF power transistors have limitations in impedance matching due to their flat metal base design, restricting RF bandwidth and requiring improved thermal conductivity and expansion coefficients.

Innovation Solution

A semiconductor package component with a base substrate featuring a protrusion on which a die chip is mounted, connected to a lead frame via a wire, allowing for reduced wire length and enhanced impedance matching, thermal conductivity, and reliability, using a ceramic layer and multi-layer metal structure with specific thermal properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a flat metal base is used for the base substrate, then the manufacturing process is simple, but impedance matching during wire bonding is limited and RF bandwidth is restricted

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidimpedance matching
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent introduces a protrusion structure that rises from the flat base substrate surface, transitioning from a two-dimensional flat surface to a three-dimensional structured surface. This dimensional change allows the wire bonding process to occur at an elevated position, effectively reducing the wire length and improving impedance matching without complicating the base manufacturing process

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If a protrusion is added to the base substrate to reduce wire length, then impedance matching is improved, but the device complexity increases

Engineering Contradiction:
Improveimpedance matchingVSAvoidbase substrate structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Instead of making the entire base substrate complex, the patent applies the protrusion structure only in the local area where wire bonding occurs. The majority of the base substrate remains flat and simple, while only a specific localized region features the elevated protrusion structure, thereby minimizing the increase in overall device complexity

Inventive Principle:
Principle #3Local quality

3Reliability

If the wire length is reduced by using a protrusion, then impedance matching is improved, but the manufacturing process becomes more complex

Engineering Contradiction:
Improveimpedance matchingVSAvoidwire bonding process
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The protrusion structure is pre-formed on the base substrate before the wire bonding process. This preliminary action of creating the elevated surface feature in advance allows the subsequent wire bonding to be performed more easily with reduced wire length, as the positioning and geometry are already established rather than requiring complex real-time adjustments

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11869857B2Semiconductor package component
Publication Date: 2024.01.09 AMOSENSE CO LTD
  • US11869857B2 patent drawing
  • US11869857B2 patent drawing
  • US11869857B2 patent drawing

AI summary

A semiconductor package component and a semiconductor package including the same. More particularly, the present disclosure relates to a semiconductor package component for an RF power transistor and a semiconductor package including the same. Further particularly, it relates to a semiconductor package component for an RF power transistor and a semiconductor package including the same, capable of adjusting impedance matching of an RF transistor by connecting a die chip and a lead frame with a wire so that a length of the wire is reduced as much as the protruding height of the base substrate.