RF Signal Path Phase Rotation Measurement via Heterodyne Mixing
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Solution Overview
Problem
Phased-array systems face challenges in accurately measuring phase rotation, which affects beam steering and array calibration, leading to inefficiencies in applications like broadcasting, radar, and wireless communication systems.
Innovation Solution
A method and system for measuring phase rotation using signal mixing, where a common node is used to provide signals to multiple signal paths with phase rotation circuits, and test signals with known phase delays are mixed to obtain measurement signals, allowing for precise phase adjustment and calibration of each path.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional measurement methods are used for phase rotation in phased-array systems, then the measurement process becomes complex and time-consuming, but measurement precision is insufficient
Solution Approach 1:
The patent introduces an intermediary frequency mixing process between the test signal and reference signal to measure phase rotation. Instead of directly measuring the phase difference between multiple signal paths, the system uses a local oscillator signal to mix with the test signal, converting the high-frequency phase measurement problem into a lower-frequency intermediate frequency measurement, which simplifies the measurement system while improving precision
Solution Approach 2:
The patent replaces complex mechanical or direct electrical phase comparison methods with frequency mixing based on electromagnetic signal processing. By using frequency converters and intermediate frequency stages, the system substitutes direct phase measurement with a multi-stage frequency transformation process, achieving higher precision with a more systematic approach
2Reliability
If multiple test paths are used to measure different signal paths, then measurement completeness improves, but measurement time increases
Solution Approach 1:
The patent employs periodic switching between different test paths using electronic switches, allowing the system to sequentially measure multiple signal paths in a systematic periodic manner. This approach ensures complete measurement coverage while optimizing the measurement sequence to minimize total measurement time
Solution Approach 2:
The patent designs a universal measurement architecture where a single test signal source and reference oscillator can measure multiple different signal paths through switching. The same measurement circuitry serves multiple functions by measuring different paths sequentially, eliminating the need for dedicated measurement equipment for each path and reducing overall measurement time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables precise measurement and calibration of phase adjustments in phased-array systems, improving beam steering accuracy and reducing errors, thereby enhancing the performance of phased-array systems in various applications.
Implementation Method 1
mixing the first signal with the second signal to obtain a measurement signal of the selected signal path
Data Source
AI summary
An embodiment method for signal path measurement includes providing a first signal at a common node coupled to a plurality of signal paths that each includes a respective phase rotation circuit. The method also includes providing a second signal, over a first test path, to a first node coupled to a first signal path of the plurality of signal paths, providing the second signal, over a second test path, to a second node coupled to a second signal path of the plurality of signal paths, selecting a signal path from the plurality of signal paths, transmitting, over the selected signal path, one of the first signal and the second signal, and mixing the first signal with the second signal to obtain a measurement signal of the selected signal path. A difference in phase delay between the second test path and the first test path includes a first known phase delay.