RF Probe Assembly Impedance Matching for Phased Array Testing
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Solution Overview
Problem
The high cost and complexity of phased array antenna manufacturing, particularly due to the need for precise phase control in satellite communication systems, hinder the commercialization of satellite communication-based products.
Innovation Solution
A method and system for testing radio-frequency (RF) devices using a probe assembly with a resistive element in parallel connection to match input impedances, facilitating accurate phase control and reducing manufacturing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If precise phase control is implemented in phased array antenna, then measurement precision and manufacturing precision are improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent introduces a probe assembly as an intermediary device between the testing tool and the RF device. This probe assembly includes a probe needle that couples to the signal port and a resistive element that couples to the probe needle in parallel connection. The resistive element has a resistance value equal to the input impedance of the testing tool, creating an impedance matching bridge that simplifies the testing system while maintaining precise measurement capabilities.
2Measurement precision
If probe assembly with impedance matching is used, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The probe assembly serves as an intermediary component that bridges the testing tool and the RF device under test. It includes a probe needle for electrical connection and a resistive element for impedance matching, enabling accurate measurements without requiring the testing tool to directly interface with the RF device.
Solution Approach 2:
The patent changes the impedance parameter by introducing a resistive element with a specific resistance value equal to the input impedance of the testing tool. This parameter change creates an impedance match that improves measurement precision by eliminating reflection losses and ensuring accurate signal transmission during testing.
3Measurement precision
If complex testing system is used, then measurement precision is improved, but ease of operation deteriorates
Solution Approach 1:
The probe assembly acts as a simple intermediary device that connects the testing tool to the RF device. By incorporating the impedance matching function directly in the probe assembly, the system becomes easier to operate while maintaining high measurement precision, as the complexity is encapsulated in the probe assembly rather than the overall testing system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables easier and more accurate testing of phased array antennas, leading to lower-cost RF transmitter and receiver manufacturing with improved power efficiency and reliability.
Implementation Method 1
arranging a first resistive element to couple to the first probe needle in parallel connection to make a first input impedance looking into the probe assembly from the testing tool substantially equal to a second input impedance looking into the testing tool from the probe assembly
Data Source
AI summary
A method for manufacturing a first radio-frequency (RF) device, including: receiving a substrate having the first RF device, wherein the first RF device has a signal port for receiving or transmitting RF signals with an input impedance greater than ten times an input impedance of a testing tool; causing a probe assembly to connect to the signal port and the testing tool; and causing the probe assembly to connect to a first terminal of a resistive element having a resistance equal to the input impedance.