RF Probe Variable Impedance Pin Length Adjustment

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Solution Overview

Problem

Conventional RF probes face limitations in operating frequency due to their physical structure, becoming invasive at high frequencies as the probe length approaches the wavelength of the signal, leading to increased insertion loss and disturbance of the circuit under test.

Innovation Solution

The RF probe design incorporates at least two probe pins with variable impedance at their ends, allowing for adjustable high impedance characteristics to maintain non-invasive behavior across a broader frequency range by transforming impedance based on pin length and characteristic impedance, using mechanisms like variable phase shifters and termination circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the probe pin length L is made short to maintain non-invasive behavior at high frequencies, then the operating frequency range is extended, but the manufacturing precision and assembly difficulty increase due to practical limits of micromachining technologies and electronics assembly techniques

Engineering Contradiction:
Improveoperating frequency rangeVSAvoidprobe pin length precision
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent makes the probe pin length adjustable rather than fixed, allowing dynamic adaptation to different frequency ranges. The probe pin can be extended or reconfigured to optimal lengths for different operating frequencies, enabling the probe to maintain non-invasive behavior across a broader frequency spectrum while avoiding the manufacturing precision constraints of fixed short pins.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the physical parameter of probe pin length to optimize performance at different frequencies. By allowing the probe pin length to be adjusted or reconfigured, the system can adapt to different frequency ranges without being constrained by the fixed manufacturing precision limits, thus extending the operating frequency range while maintaining measurement accuracy.

Inventive Principle:
Principle #35Parameter changes

2Loss of energy

If the probe pin length L is made short to maintain non-invasive behavior, then insertion loss is reduced, but the device complexity increases due to the need for advanced micromachining and assembly techniques

Engineering Contradiction:
Improveinsertion lossVSAvoidmicromachining and assembly complexity
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

The adjustable probe pin length allows the system to dynamically optimize insertion loss for different frequency ranges without requiring permanently complex micromachining. The probe can be configured with appropriate pin lengths for specific applications, avoiding the need for always-present advanced manufacturing complexity while maintaining low insertion loss when needed.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

By changing the probe pin length parameter based on operating frequency requirements, the system achieves low insertion loss without permanently increasing device complexity. The ability to adjust or reconfigure pin lengths allows optimization for each specific application rather than requiring complex manufacturing for all possible scenarios.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If conventional fixed-pin probes are used with high impedance circuitry, then non-invasive measurement is achieved at low frequencies, but the operating frequency is limited to below 3 GHz

Engineering Contradiction:
Improvenon-invasive measurement capabilityVSAvoidoperating frequency limit
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent introduces dynamic adjustability to the probe pin configuration, allowing the system to maintain non-invasive measurement capabilities across different frequency ranges. By adjusting the probe pin length or configuration, the probe can preserve high impedance characteristics at higher frequencies where conventional fixed pins would become invasive, thus extending the operating frequency beyond 3 GHz while maintaining measurement precision.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the physical configuration parameter of the probe pin to extend operating frequency while maintaining non-invasive measurement. By allowing the probe pin length or structure to be adjusted, the system can optimize impedance matching and minimize invasiveness at higher frequencies, breaking the 3 GHz limitation of conventional fixed-pin probes.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design extends the operating frequency range of the RF probe beyond conventional limits while maintaining non-invasive properties, reducing insertion loss and enabling continuous frequency band operation by adjusting impedance transformation frequencies.

Implementation Method 1

the minimum manufacturable length L, measured from the probe tip (tip of the probe pins 12) to the high impedance element/circuit 14 of the RF probe 10, becomes a limiting factor when using the probes at high frequencies. When this length L becomes comparable to the wavelength of the operating frequency, a behavior called impedance transformation converts a previously high input impedance of the RF probe 10 into a low impedance.

Methodology Applied
Scientific EffectImpedance transformation: Electrical Impedance Tomography

Data Source

PatentUS9772350B2RF probe
Publication Date: 2017.09.26 ADVANTEST CORP
  • US9772350B2 patent drawing
  • US9772350B2 patent drawing
  • US9772350B2 patent drawing

AI summary

Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe includes at least two probe pins having first ends for contacting the circuit and second ends. Furthermore, the RF probe includes a provider for providing a variable impedance at the second ends of the probe pins. The RF probe is configured to provide the probe signal based on a signal propagating along at least one of the probe pins.