Integrated RF Receiver Self-Test via On-Chip Signal Injection
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Solution Overview
Problem
There is a need for RF transceivers with improved self-test capabilities to enhance the reliability of radar sensors and other wireless communication systems, as existing technologies lack effective methods to ensure functional safety and detect malfunctions in RF front-end components.
Innovation Solution
An RF receiver device with a test signal generator integrated into the semiconductor chip, which generates an RF test signal and uses a coupler to inject it into the receive channel, allowing a signal processor to determine if the signal meets predetermined criteria, thereby enabling regular testing and quick detection of component malfunctions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If RF transceivers are highly integrated into single chip packages, then device complexity is reduced and manufacturing is simplified, but reliability and self-test capability deteriorate due to lack of testing infrastructure
Solution Approach 1:
The patent merges the test signal generator with the RF receiver circuitry on the same semiconductor chip. The test signal generator shares the down-conversion and digitization infrastructure with the main receiver, eliminating the need for separate external testing equipment while maintaining full testing capability. This integration resolves the contradiction by combining testing functionality with the highly integrated receiver design.
Solution Approach 2:
The down-conversion and digitization circuitry serves dual purposes: it processes both regular RF input signals and test signals. The same analog-to-digital converter and signal processing paths are used for both operational and testing modes, allowing the highly integrated design to maintain reliability through self-testing without adding separate dedicated testing infrastructure.
2Reliability
If separate testing equipment is used for RF transceivers, then reliability testing is improved, but device complexity and ease of operation worsen due to additional external components
Solution Approach 1:
The RF transceiver performs self-testing through the integrated test signal generator that produces test signals and uses the existing receiver infrastructure to process and evaluate them. The system tests itself without requiring external testing equipment, thereby improving ease of operation while maintaining reliability testing capability. The receiver evaluates its own performance by processing test signals through the same signal path it uses for operational signals.
3Reliability
If integrated test signal generator is added to semiconductor chip, then self-test capability is improved, but manufacturing precision requirements increase
Solution Approach 1:
The test signal generator is merged with the existing receiver circuitry, sharing common infrastructure such as the down-conversion mixers, local oscillators, and analog-to-digital converters. This approach minimizes the additional manufacturing complexity by reusing existing high-precision components rather than adding entirely new testing subsystems with separate precision requirements.
Solution Approach 2:
The coupler serves as an intermediary element that interfaces the test signal generator with the receiver input path. By using this intermediate component, the test signals can be properly coupled into the existing high-precision receiver infrastructure without directly interfering with the sensitive operational signal paths, thereby maintaining manufacturing feasibility while enabling self-testing.
Data Source
AI summary
An RF receiver device includes a semiconductor chip in a chip package, and a test signal generator integrated in the chip. The test signal generator generates an RF test signal including first information. An RF receiver circuit integrated in the chip receives an RF input signal, down-converts the RF input signal into an intermediate frequency (IF) or base band, and digitizes the down-converted signal to obtain a digital signal. An RF receive channel includes a coupler having first and second input ports and an output port. The output port is coupled to the input of the RF receiver circuit, the first input port receives an antenna signal and the second input port receives the test signal from the test signal generator. A signal processor is integrated in the chip and determines, during a test cycle, whether the first information in the digital signal matches a predetermined criterion.