RF Shield Defect Detection Using Isolated Antenna Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods fail to accurately detect shield defects in semiconductor devices with conformal shielding due to interference from external noise sources and signals radiated between the device and the test board, making visual inspections unreliable.
Innovation Solution
A system comprising a shield box with RF isolation, an antenna, and absorption materials to minimize external noise and signal interference, allowing for accurate measurement of the radiated signal level through the conformal shield.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If visual inspection is used to detect shield defects, then the inspection process is simple and fast, but the detection reliability is insufficient for conformal shields
Solution Approach 1:
The patent replaces visual inspection (mechanical/optical system) with an electromagnetic field-based measurement system. A vector network analyzer measures S21 parameters to detect shield defects, substituting human visual inspection with automated electromagnetic field analysis that can reliably detect defects in conformal shields regardless of visual appearance.
Solution Approach 2:
The patent introduces an intermediary measurement system consisting of transmit and receive antennas, test fixtures, and signal analysis equipment. This intermediary system indirectly detects shield defects by measuring electromagnetic field interactions rather than directly observing the shield structure, enabling reliable detection of conformal shield defects.
2Device complexity
If radiated signal level measurement is performed without isolation, then the measurement setup is simple, but external noise and interfering signals prevent accurate defect detection
Solution Approach 1:
The patent segments the measurement environment into isolated zones using RF shielded rooms and isolated test fixtures. The measurement system divides the electromagnetic environment into controlled regions, separating the device under test from external noise sources and interfering signals, enabling accurate radiated signal level measurements.
Solution Approach 2:
The patent creates an electromagnetically inert environment using RF shielded rooms with conductive walls and absorptive materials. This inert electromagnetic atmosphere blocks external noise and prevents signal interference, allowing accurate measurement of radiated signals from the device under test without contamination from external sources.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable detection of shield defects in semiconductor devices with conformal shielding by isolating external noise and minimizing interfering signals, providing a more accurate measurement of the signal radiated through the shield.
Implementation Method 1
A system comprising a shield box with RF isolation
Implementation Method 2
measurement of the radiated signal level emitted from the device under test
Implementation Method 3
an antenna, and absorption materials to minimize external noise and signal interference
Data Source
AI summary
An apparatus for testing a semiconductor device having an RF shield has a shield box. A test board is positioned in an interior of the shield box. A first surface of the test board has an area for attaching the semiconductor device. A shield device is attached to a second surface of the test board and beneath the area for attaching the semiconductor device. An antenna is positioned in the interior of the shield box and above the area for attaching the semiconductor device.