RF Signal Analysis Circuitry for DUT Test Program Debugging
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Solution Overview
Problem
Current wireless device test systems face complexity and increased costs due to lengthy and complex test programs when testing devices that support multiple wireless signal technologies, requiring external instruments for debugging, which prolongs the debugging process and increases costs.
Innovation Solution
A system and method that includes signal routing, data signal source, data signal analysis, signal conversion circuitry, and a state machine to analyze and convert RF data signals from a device under test, allowing for off-line debugging and reducing the need for external instruments by capturing and storing signal and control data for later analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If test programs are extended to support multiple wireless signal technologies, then the testing capability and versatility are improved, but the program complexity and debugging difficulty increase
Solution Approach 1:
The patent segments the complex test program into distinct functional modules, each handling specific wireless technology protocols. This modular structure allows independent development and debugging of each module, reducing overall program complexity while maintaining multi-technology support capability.
Solution Approach 2:
The patent introduces an intermediary layer that standardizes the interface between different wireless technology modules and the core test system. This intermediary abstraction layer simplifies program structure by providing uniform access methods across diverse technologies, reducing debugging difficulty.
2Measurement precision
If external instruments are used for debugging, then measurement precision and diagnostic capability are improved, but the device complexity and cost increase
Solution Approach 1:
The patent implements self-service debugging capabilities within the test system itself, through integrated logging and analysis functions that eliminate the need for external diagnostic instruments. The system automatically captures and analyzes test data, providing sufficient diagnostic precision without adding external complexity.
Solution Approach 2:
The patent creates a multi-functional debugging subsystem that combines multiple diagnostic functions into a single integrated component. This universal debugging module handles various measurement and analysis tasks that would otherwise require separate external instruments, reducing system complexity while maintaining diagnostic capability.
3Reliability
If longer signal sequences are captured for multi-technology testing, then the testing comprehensiveness is improved, but the test time and processing load increase
Solution Approach 1:
The patent performs preliminary actions by pre-configuring test parameters and signal sequences specific to each wireless technology before actual testing begins. This preparation work includes setting up appropriate modulation schemes, frequency ranges, and protocol parameters, which streamlines the actual test execution and reduces overall test time while maintaining comprehensiveness.
Solution Approach 2:
The patent implements continuous useful action through parallel processing of multiple signal sequences and technologies simultaneously. The system processes different wireless technology tests in parallel rather than sequentially, capturing longer signal sequences without proportionally increasing total test time, thereby maintaining comprehensiveness while reducing time loss.
Data Source
AI summary
A system and method for facilitating comparison of radio frequency (RF) data signals transmitted by a device under test (DUT) and received by a test system. A RF data signal received from a DUT is analyzed to provide analysis data indicative of conformance of the DUT operation with one or more applicable signal standards. The RF data signal is also converted to related conversion data that can be stored with state machine data corresponding to states of the signal testing subsystem. This state machine data can then be processed as needed with the analysis data and conversion data for off-line tasks such as debugging new test programs and procedures.