RF Measurement Signal Analysis for Leakage and Reflection Errors

The patent converts the harmful effect of signal leakage and reflections into a beneficial measurement tool. By capturing these unwanted signal portions and using them as reference signals for calibration, the system transforms measurement errors into calibration data that improves overall measurement accuracy. The leakage and reflection signals, instead of being discarded as noise, are utilized to characterize and compensate for system imperfections.

The patent applies parameter changes by modifying the calibration process to account for systematic errors. Through calibration measurements using known reference devices, the system determines calibration parameters (such as leakage coefficients and reflection coefficients) that are then applied to correct subsequent measurements. This changes the measurement parameters from raw signals to corrected values that compensate for system imperfections.

The patent implements preliminary action by performing calibration measurements before actual device measurements. The calibration process characterizes the test system's imperfections (leakage, reflections, impedance mismatches) in advance, storing these characteristics as calibration parameters. This preliminary characterization enables subsequent measurements to be corrected automatically without requiring complex real-time adjustments during actual testing.

The patent uses copying by creating reference measurements with known calibration standards (such as through-connections, open circuits, or short circuits). These reference measurements copy or replicate the measurement process under known conditions, allowing the system to determine calibration parameters that represent the system's behavior. These copied reference data are then used to correct actual device measurements through mathematical processing.