RF Test Signal Analysis Using One Receiver for Reference Separation

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Solution Overview

Problem

The need for a cost-efficient test and/or measurement system is highlighted by the requirement of an additional wideband measurement receiver for receiving a reference signal, which significantly increases manufacturing costs.

Innovation Solution

A test and/or measurement system that merges a reference signal and a measurement signal into a single analysis signal path, utilizing a single measurement receiver, and separates them based on predefined waveforms, group delay differences, or amplitude differences, thereby reducing the need for multiple receivers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a second wideband measurement receiver is added to receive the reference signal, then the measurement system can accurately receive both reference and measurement signals, but the manufacturing cost significantly increases

Engineering Contradiction:
Improvesignal reception accuracyVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent merges the reference signal and measurement signal into a single analysis signal path that is received by one measurement receiver. The reference signal is generated by the signal generator circuit and combined with the measurement signal from the device under test, allowing both signals to be processed by a single receiver instead of requiring separate receivers for each signal type.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent segments the signal processing by separating the reference signal generation function from the measurement signal reception function. The signal generator circuit creates the reference signal independently, while the measurement receiver focuses on receiving the combined analysis signal, which is then processed to separate the reference and measurement components through signal analysis.

Inventive Principle:
Principle #1Segmentation

2Ease of manufacture

If a single measurement receiver is used to receive both reference and measurement signals, then the manufacturing cost is reduced, but the system complexity increases due to signal separation requirements

Engineering Contradiction:
Improvemanufacturing costVSAvoidsignal processing complexity
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The patent introduces an analysis signal path as an intermediary that combines the reference signal and measurement signal before they reach the measurement receiver. This intermediary path allows the single receiver to handle both signal types by receiving their combined version, which is then separated through controlled signal analysis based on the predefined waveform characteristics.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent utilizes parameter changes in the signal waveforms to enable separation. The reference signal and measurement signal are distinguished through their different waveform parameters (such as timing, amplitude, or frequency characteristics) that are predetermined and known to the analysis circuit, allowing digital or analog separation without requiring multiple physical receivers.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250370029A1Test and/or measurement system
Publication Date: 2025.12.04 ROHDE & SCHWARZ GMBH & CO KG
  • US20250370029A1 patent drawing
  • US20250370029A1 patent drawing
  • US20250370029A1 patent drawing

AI summary

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.