Integrated RF Test Chamber with Internal Feed-Through
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Solution Overview
Problem
Current wireless communication test systems are inflexible, costly, and require extensive space due to the need for multiple RF feed-through ports and auxiliary test equipment, which increases complexity and electromagnetic interference shielding requirements.
Innovation Solution
The integration of an internal wall within an electromagnetically-isolating chamber to create separate test instrument and device chambers, using internal RF feed-through ports to couple test instruments with devices-under-test, reducing the need for external ports and shielding, and allowing for more complex test configurations with fewer external connections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple external RF feed-through ports are used to connect test instruments to devices-under-test, then wireless communication testing can be performed, but the chamber size, weight, and cost increase significantly
Solution Approach 1:
The patent places test instruments inside the electromagnetically-isolating chamber, nesting them within the DUT chamber. This eliminates the need for multiple external RF feed-through ports, as instruments can communicate wirelessly with devices-under-test while remaining physically contained within the chamber structure, thereby reducing chamber weight and complexity
Solution Approach 2:
The patent combines the test instrument chamber and DUT chamber into a single integrated electromagnetically-isolating chamber. This merging eliminates the need for separate external connections and individual shielding for each instrument, reducing overall system weight and cost while maintaining testing versatility
2Adaptability or versatility
If multiple external RF feed-through ports are installed in the chamber walls, then test instruments can be connected, but the manufacturing cost and complexity increase
Solution Approach 1:
By nesting test instruments inside the chamber rather than connecting them externally through multiple feed-through ports, the chamber structure requires fewer penetrations and complex sealing arrangements, significantly simplifying manufacturing processes and reducing production costs
Solution Approach 2:
The integrated chamber design merges multiple functional spaces into a single manufactured unit, eliminating the need for complex multi-component assembly and reducing manufacturing steps, thereby improving ease of manufacture while maintaining full instrument connectivity
3Object-affected harmful factors
If each test instrument is individually electromagnetically shielded, then electromagnetic interference is prevented, but the system size and cost increase
Solution Approach 1:
The patent merges individual instrument shielding requirements into a single chamber-level electromagnetic isolation solution. The entire chamber acts as one large electromagnetically-isolating enclosure, eliminating the need for separate shields around each instrument, thereby reducing total system area while maintaining EMI protection
Solution Approach 2:
The patent segments the internal chamber space into distinct regions (test instrument chamber and DUT chamber) using internal partitions or positioning, allowing instruments to be placed inside the electromagnetically-isolating chamber without requiring individual external shielding, thus reducing overall system area
4Adaptability or versatility
If a large number of auxiliary test equipment are added for complex wireless test scenarios, then testing capability is enhanced, but the system becomes more complex and takes up more space
Solution Approach 1:
The patent merges multiple auxiliary test equipment functions into integrated software-based solutions running on general-purpose computing devices within the chamber. This consolidation reduces the number of separate physical instruments needed, thereby reducing system complexity while maintaining enhanced test scenario capabilities
Solution Approach 2:
The patent employs multi-functional test instruments and software platforms that can perform multiple testing functions simultaneously or sequentially. This universality reduces the total number of devices required for complex test scenarios, simplifying the system while expanding testing capabilities
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces the size, weight, and cost of the test system by minimizing the number of external RF feed-through ports and eliminating the need for individual shielding of test instruments, while enabling more complex and efficient testing scenarios.
Implementation Method 1
electromagnetically-isolating external walls that define a chamber
Implementation Method 2
an internal RF feed-through port that passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a wireless device-under-test (DUT) disposed in the internal device testing chamber
Data Source
AI summary
An apparatus for testing electromagnetic components includes electromagnetically-isolating external walls that define a chamber. An internal wall is attached to one or more of the electromagnetically-isolating external walls to form an internal test instrument chamber and an internal device testing chamber. An internal RF feed-through port passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a wireless device-under-test (DUT) disposed in the internal device testing chamber. One or more external RF feed-through ports can pass through one of the electromagnetically-isolating external walls to electrically couple the DUT and/or the test instrument to a second wireless device.