Synchronized RF Testing for Parallel Multi-DUT Calibration
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Solution Overview
Problem
Current RF calibration and testing methods for multiple devices under test (DUTs) are inefficient as they are performed sequentially, leading to underutilization of testing instrument resources and prolonged execution times.
Innovation Solution
A method and system for parallel RF testing of multiple DUTs using synchronized signals to occupy testing instrument resources simultaneously, allowing simultaneous analysis and processing of RF signals across multiple DUTs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If RF calibrations and testing are performed sequentially on multiple DUTs, then each DUT receives dedicated testing instrument resources ensuring accurate measurement, but the overall testing execution time is prolonged and resource utilization is low
Solution Approach 1:
The patent segments the testing process into distinct phases (calibration phase and measurement phase) and further divides time resources into time slots. Different DUTs are assigned to different time slots for calibration while others perform measurement, allowing parallel processing of multiple DUTs without compromising measurement accuracy
Solution Approach 2:
The patent performs calibration actions in advance during dedicated calibration time slots before actual measurements are taken. This preliminary calibration ensures that when measurements occur, the instruments are properly configured and calibrated, maintaining measurement precision while enabling faster overall testing through parallel operations
2Productivity
If multiple commands are merged into command sets to reduce execution time, then testing speed increases, but the complexity of command management and resource coordination increases
Solution Approach 1:
The patent segments command sets into smaller, more manageable units that correspond to specific time slots and DUTs. Each command set is designed to control specific operations (calibration, measurement) for specific DUTs during specific time periods, reducing the complexity of coordinating multiple commands while maintaining high testing speed through efficient parallel execution
3Measurement precision
If testing instrument resources are dedicated to single DUT at a time, then measurement accuracy is ensured, but resource utilization efficiency decreases
Solution Approach 1:
The patent implements dynamic resource allocation where testing instrument resources (signal generator, signal analyzer) are dynamically assigned to different DUTs based on their current testing phase. The system transitions from static dedicated assignment to dynamic time-slot-based assignment, allowing resources to serve multiple DUTs in sequence while maintaining measurement precision through proper calibration timing
Solution Approach 2:
The patent ensures continuous utilization of testing instrument resources by eliminating idle time between operations. While one DUT is being calibrated, another DUT undergoes measurement, and vice versa. This continuous action maximizes resource utilization efficiency without compromising measurement accuracy through proper synchronization and timing management
Data Source
AI summary
An RF testing method is applied between a testing instrument and multiple devices under test at least including a first DUT and a second DUT. The testing instrument includes a signal generator and a signal analyzer. A sync signal is sent to the testing instrument and the first DUT, so that the first DUT occupies the signal generator to receive a testing signal from the signal generator. The first DUT sends an uplink signal to the signal analyzer based on the testing signal to occupy the signal analyzer for signal analysis at a first point in time. The sync signal is sent to the testing instrument and the second DUT, so that the second DUT occupies the signal generator to receive the testing signal from the signal generator at a second point in time. The first point in time is parallel to the second point in time.