Ring Oscillator Burn-In Test Using an Undegraded Reference Circuit
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Solution Overview
Problem
The existing burn-in test methods for semiconductor devices require measuring characteristics before and after the test, doubling the test execution time and increasing production costs.
Innovation Solution
A semiconductor device with a voltage generation circuit, first and second oscillation signal generation circuits, and a degradation detection circuit, where the second oscillation signal generation circuit is designed to minimize degradation during the burn-in test by receiving a ground voltage, allowing for efficient post-test degradation measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If characteristics are measured two times (before and after burn-in test), then the reliability of the semiconductor device can be evaluated, but the test execution time increases
Solution Approach 1:
The patent applies preliminary action by pre-configuring the second oscillation signal generation circuit to operate under ground voltage conditions during the burn-in test. This circuit is prepared in advance to remain undegraded, so that after the burn-in test completes, it can immediately serve as a fresh reference for comparison without requiring a separate pre-test measurement step. The reference circuit is set up beforehand to withstand the test conditions while the device under test undergoes degradation.
2Measurement precision
If characteristics are measured two times (before and after burn-in test), then the degree of degradation can be accurately determined, but the production cost increases
Solution Approach 1:
The patent implements preliminary action by configuring the second oscillation signal generation circuit in advance to operate under ground voltage during burn-in test, ensuring it remains undegraded. This pre-configuration allows the circuit to serve as a built-in reference that eliminates the need for separate pre-test measurement equipment and procedures, thereby reducing production costs while maintaining accurate degradation measurement capability.
3Adaptability or versatility
If the second oscillation signal generation circuit receives normal operating voltage, then it can reflect real device behavior, but it will undergo significant degradation during burn-in test
Solution Approach 1:
The patent applies local quality by creating two distinct operational conditions for the two oscillation signal generation circuits. The first circuit operates under normal voltage to represent real device behavior, while the second circuit operates under ground voltage to maintain stability and avoid degradation. Each circuit is locally optimized for its specific function, allowing both real behavior representation and test reliability to be achieved simultaneously.
Data Source
AI summary
A semiconductor device may be provided. The semiconductor device may include a first oscillation signal generation circuit for generating a first oscillation signal. The semiconductor device may include a second oscillation signal generation circuit for generating a second oscillation signal. The second oscillation signal generation circuit may be provided with a test voltage. The test voltage may be generated based on a burn-in test signal.