Single Ring Oscillator Layout for Coupling Noise Characterization
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Solution Overview
Problem
Current design techniques for application-specific integrated circuit (ASIC) chips face challenges in accurately modeling coupling noise due to physical differences in layout placement and wiring, leading to setup and hold issues if improper modeling occurs.
Innovation Solution
A method using a single ring oscillator with stages designed to measure specific critical parameters of coupling noise, ensuring identical placement and wiring, and positioned within the integrated circuit to eliminate physical layout offsets, allowing for accurate measurement of in-phase and out-of-phase coupling effects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple ring oscillators are used to measure different coupling parameters, then measurement comprehensiveness is improved, but device complexity and layout variability increase
Solution Approach 1:
The patent applies universality by designing a single ring oscillator that can measure multiple coupling noise parameters (in-phase coupling, out-of-phase coupling, different wire lengths) through configuration changes rather than requiring separate oscillators for each measurement type. This reduces device complexity while maintaining measurement comprehensiveness.
Solution Approach 2:
The ring oscillator is divided into multiple stages, where each stage can be independently configured to measure specific coupling parameters. This segmentation allows the single oscillator to function as multiple specialized measurement units, resolving the contradiction between comprehensive measurement and structural simplicity.
2Adaptability or versatility
If physical layout differences are introduced in ring oscillator stages, then measurement of different coupling scenarios is enabled, but modeling errors due to placement variability increase
Solution Approach 1:
The patent applies local quality by maintaining identical physical layout and wiring for all ring oscillator stages, ensuring that only the electrical coupling conditions differ rather than physical placement. This eliminates layout-induced modeling errors while still enabling measurement of different coupling scenarios through electrical configuration variations.
Data Source
AI summary
A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.


