Ring Oscillator Flicker Noise Measurement via Phase Noise Slope Ratio
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Solution Overview
Problem
Accurate measurement of flicker noise in electronic devices, especially at smaller technology nodes, is challenging due to high error factors in external equipment measurements and simulations, which affects device performance and is costly.
Innovation Solution
A flicker noise measurement circuit is integrated within the device, utilizing a combination of phase noise measurement and a ratio of the slope of the output waveform's rise to fall, allowing for inexpensive and accurate determination of flicker noise by adjusting the number of stages and slope rise/fall ratio.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external equipment is used to measure flicker noise, then measurement can be performed, but measurement precision is poor with high error factors
Solution Approach 1:
The patent merges the flicker noise measurement function directly into the electronic device by integrating a ring oscillator circuit within the device itself. This eliminates the need for separate external measurement equipment and achieves accurate flicker noise measurement by combining phase noise measurement capabilities with waveform slope analysis, thereby resolving the contradiction between measurement precision and device complexity.
Solution Approach 2:
The patent introduces a ring oscillator as an intermediary component that converts flicker noise into measurable phase noise and waveform characteristics. By using the ring oscillator as a mediator, the measurement system can accurately capture flicker noise through phase noise measurement and slope ratio analysis without requiring complex external equipment, thus improving measurement precision while maintaining manageable system complexity.
2Measurement precision
If simulation-based extrapolation is used to determine flicker noise, then measurement cost is reduced, but measurement precision deteriorates with considerable error
Solution Approach 1:
The patent enables the electronic device to perform its own flicker noise measurement through self-contained circuitry. The ring oscillator and measurement circuitry are integrated within the device, allowing it to autonomously measure its own flicker noise characteristics without requiring external simulation equipment or complex manufacturing processes, thereby achieving both high precision and ease of manufacture.
Solution Approach 2:
The patent utilizes parameter changes in the ring oscillator circuit, specifically varying the number of stages and observing the relationship between oscillation frequency and waveform slope ratios. By changing these parameters and analyzing the resulting phase noise and slope characteristics, the system can accurately determine flicker noise with simple implementation, resolving the contradiction between measurement precision and manufacturing simplicity.
3Measurement precision
If the number of stages in the measurement circuit is increased, then measurement accuracy improves, but device complexity increases
Solution Approach 1:
The patent employs a dynamic approach where the number of stages in the ring oscillator can be varied or optimized based on measurement requirements. By making the circuit configuration adaptable rather than fixed, the system can achieve high measurement precision with appropriate stage counts while avoiding unnecessary complexity, thus resolving the contradiction between accuracy and circuit complexity.
Data Source
AI summary
A flicker noise measurement circuit includes a first section. The first section includes a plurality of first stages connected in series. The first section includes a first feedback switching element configured to selectively feedback an output of the plurality of first stages to an input of the plurality of first stages. The first section includes a first section connection switching element. The flicker noise measurement circuit includes a second section connected to the first section. The second section includes a plurality of second stages connected in series, wherein the first section connection switching element is configured to selectively connect the plurality of second stages to the plurality of first stages. The second section includes a second feedback switching element configured to selectively feedback an output of the plurality of second stages to the input of the plurality of first stages.