Image Inspection Merging RIP and Scan References
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Solution Overview
Problem
Conventional printing inspection systems face challenges in achieving high accuracy due to factors such as excessive detection in RIP inspection and overlooking defects in scan inspection, leading to inconsistent results.
Innovation Solution
An image processing apparatus that performs both RIP and scan inspections, using an original image as a first reference and a read image as a second reference, and displays results in a way that identifies defects accurately, thereby reducing excessive detection and improving inspection accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If RIP inspection using an original image as reference is performed, then the inspection can detect printing defects, but excessive detection occurs reducing accuracy
Solution Approach 1:
The patent combines RIP inspection results and scan inspection results through a result synthesis unit. This merging of two different inspection approaches allows the system to leverage the strengths of each method while compensating for their individual weaknesses, thereby reducing excessive detection and improving overall inspection accuracy.
Solution Approach 2:
The system uses the read image obtained from scan inspection as a reference to adjust and refine the RIP inspection results. This feedback mechanism allows the system to identify and correct excessive detections by comparing against the actual printed material appearance, thereby improving measurement precision.
2Ease of operation
If scan inspection using a read image as reference is performed, then the inspection can be conducted, but defects may be overlooked reducing accuracy
Solution Approach 1:
By merging scan inspection results with RIP inspection results, the system compensates for the limitation of scan inspection in detecting certain defects. The combination ensures that defects which might be overlooked in scan inspection are caught by RIP inspection, thereby improving overall measurement precision.
Solution Approach 2:
The original image serves as a reference to verify and supplement the scan inspection results. This feedback loop ensures that defects potentially missed in scan inspection are identified through comparison with the original intended design, improving defect detection accuracy.
3Device complexity
If only one inspection method is used, then the inspection process is simple, but inspection accuracy is reduced
Solution Approach 1:
The patent merges two inspection methods (RIP and scan inspection) into a unified inspection system. While this increases device complexity, it significantly improves measurement precision by reducing excessive detection and ensuring comprehensive defect detection through the complementary nature of the two methods.
Data Source
AI summary
An image processing apparatus includes a first inspecting unit configured to inspect a target image by using an original image as a first reference image, the target image being obtained by reading a material printed based on the original image, a second inspecting unit configured to inspect the target image by using, as a second reference image, a read image acquired based on reading at least one material printed based on the original image, and a display control unit configured to cause display of a result of the inspection by the first inspecting unit and a result of the inspection by the second inspecting unit in such a way that the result of the inspection by the first inspecting unit and the result of the inspection by the second inspecting unit are identifiable.