Ripple Controller for Input Sensing Unit Testing
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Solution Overview
Problem
Existing methods for testing the operation state of input sensing units in organic light emitting display devices are inadequate, making it difficult to detect defects effectively during the manufacturing process.
Innovation Solution
A test device with signal test pads, a power test pad, a test circuit, a voltage generator, and a ripple controller that applies a test signal and ripple noise to the input sensing unit, allowing for the evaluation of the operation state of the input sensing unit in synchronization with the display unit's voltage level changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing methods are used for input sensing units, then the testing process is simple, but the defect detection capability is insufficient
Solution Approach 1:
The testing device dynamically adjusts the voltage level of the sensing power voltage applied to the input sensing unit. The voltage level changes according to switching signals from the test circuit, enabling the detection of defects under varying operating conditions rather than a fixed voltage state.
Solution Approach 2:
The test circuit outputs switching signals periodically to control the voltage level changes of the sensing power voltage. This periodic action allows systematic testing of the input sensing unit under different voltage conditions, improving defect detection while maintaining structured test sequences.
2Reliability
If the input sensing unit is tested without considering display unit operation, then the testing process is independent and simple, but the operation state characterization is insufficient
Solution Approach 1:
The testing device merges the testing of the input sensing unit with the operation of the display unit. The power test pad is connected to the power pattern of the display unit, and the sensing power voltage is applied simultaneously to both systems, allowing correlated testing of their interaction.
Solution Approach 2:
The power pattern serves as an intermediary element connecting the power test pad to the display unit. The sensing power voltage applied through the power test pad is distributed to the display unit via the power pattern, enabling synchronized operation and testing of both systems.
3Measurement precision
If voltage level changes are not applied during testing, then the power consumption is low, but the operation state characterization capability is limited
Solution Approach 1:
The voltage level of the sensing power voltage is changed periodically according to switching signals from the test circuit. This periodic voltage variation enables comprehensive characterization of the input sensing unit's operation state under different voltage conditions while maintaining controlled power consumption through systematic switching.
Data Source
AI summary
A test device includes: a plurality of signal test pads electrically connected to pads of an input sensing unit; a power test pad electrically connected to a power pattern of a display unit; a test circuit configured to apply a test signal to the signal test pads; a voltage generator configured to generate a sensing power voltage; and a ripple controller configured to change a voltage level of the sensing power voltage to apply the sensing power voltage to the power test pad.