RIS Characterization Using 3D Reflection Pattern and Reflected TRP
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Solution Overview
Problem
There is a lack of reliable evaluation procedures for characterizing reconfigurable intelligent surfaces (RISs), making it difficult to compare their properties effectively, which are influenced by factors such as dimensions and reflection angles.
Innovation Solution
A method and system for characterizing RISs by repeatedly transmitting incident signals at varying angles, capturing reflected signals with probe antennas to create a 3D reflection pattern, and determining reflected total radiated power (TRP) to establish a characterization value, which can be normalized to account for size and signal strength, allowing comparison with other RISs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If RIS dimensions are increased to improve reflection coverage, then the reflection properties improve, but the comparison between different RISs becomes difficult due to size variations
Solution Approach 1:
The patent applies parameter changes by normalizing the reflected total radiated power with respect to the RIS area. This transformation converts the absolute power measurement into a density metric (power per unit area), enabling fair comparison between RISs of different sizes while preserving the beneficial effect of larger RIS areas for improved reflection coverage
2Reliability
If multiple measurement parameters are used to fully characterize RIS properties, then the characterization completeness improves, but the evaluation complexity increases
Solution Approach 1:
The patent extracts the most critical characterization parameter (reflected total radiated power) from the complex set of possible measurement parameters. By focusing on this single integrated metric that captures the overall reflection performance, the system achieves reliable characterization while avoiding the complexity of measuring and analyzing multiple separate parameters
Solution Approach 2:
The reflected total radiated power metric serves multiple characterization functions simultaneously: it accounts for RIS area effects, captures angular reflection distribution, and enables comparison across different RIS configurations. This universal metric replaces the need for multiple separate measurement procedures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and quantitative comparison of RISs by providing a characterization value that accounts for size and signal strength variations, facilitating tailored applications with improved precision.
Implementation Method 1
an incident signal is repeatedly transmitted onto the RIS at an incident angle with respect to the RIS by using a feed antenna
Implementation Method 2
Reflected signals reflected by the RIS are captured by using at least one probe antenna. The reflected signals are captured at different angles of reflection such that a three-dimensional (3D) reflection pattern is obtained
Data Source
AI summary
The present disclosure generally relates to a method and a measurement system for characterizing a reconfigurable intelligent surface of a device under test. An incident signal is repeatedly transmitted onto the reconfigurable intelligent surface at an incident angle with respect to the reconfigurable intelligent surface by using a feed antenna. Reflected signals reflected by the reconfigurable intelligent surface are captured by using at least one probe antenna. The reflected signals are captured at different angles of reflection such that a three-dimensional reflection pattern is obtained. A reflected total radiated power for the reconfigurable intelligent surface is determined based on the three-dimensional reflection pattern by using a determination circuit.