RIS Reflector Beamforming Test Setup for Precise RF Qualification
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Solution Overview
Problem
Current test setups are complex and inadequate for fully qualifying the beamforming capabilities of devices, especially satellites, which require high-quality beamforming with well-defined shapes and directivity, as small deviations can lead to significant misplacements in coverage areas.
Innovation Solution
A test system utilizing a Reconfigurable Intelligent Surface (RIS) reflector to reflect incoming signals with predefined angles, coupled with measurement application antennas and devices to qualify beamforming characteristics of devices under test, allowing simple and effective evaluation of beamforming capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex test setups are used to determine beam forming characteristics, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent introduces a reflector as an intermediary element to simplify the test setup. The reflector redirects RF signals from the device under test to the measurement antenna, enabling accurate beam forming measurements without requiring complex multi-antenna arrays or sophisticated positioning systems. This intermediary approach maintains measurement precision while significantly reducing test setup complexity.
Solution Approach 2:
The test setup is designed to be universally applicable to different beam forming devices and configurations. The reflector and measurement antenna combination can measure various beam patterns, scanning angles, and device types, eliminating the need for multiple specialized test setups. This multi-functionality reduces overall system complexity while maintaining comprehensive measurement capabilities.
2Reliability
If beamforming capabilities are tested with high precision, then reliability is improved, but test time increases
Solution Approach 1:
The reflector is pre-configured with specific geometric parameters and positioning to automatically guide RF signals to the measurement antenna. This preliminary setup eliminates the need for real-time signal routing adjustments or complex calibration procedures during testing, reducing test time while maintaining reliable beam forming verification.
Solution Approach 2:
The patent replaces complex mechanical positioning systems and active signal routing mechanisms with a static reflector structure. The reflector's fixed geometry inherently performs signal direction and focusing, eliminating time-consuming mechanical adjustments and electronic beam steering during measurement, thus reducing testing duration while preserving measurement reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient testing of beamforming devices by reflecting signals to measurement application antennas, determining beamforming quality through signal strength and directionality, facilitating easy adaptation to different devices and beam angles.
Implementation Method 1
a Reconfigurable Intelligent Surface, RIS, reflector configured to reflect an incoming signal that impinges on the RIS reflector with a predefined impinging angle as reflected signal with a predefined outgoing angle
Data Source
AI summary
The present disclosure provides a test system for testing a device under test, the test system comprising at least one measurement application antenna, and a Reconfigurable Intelligent Surface, RIS, reflector configured to reflect an incoming signal that impinges on the RIS reflector with a predefined impinging angle as reflected signal with a predefined outgoing angle, and a measurement application device coupled to the measurement application antenna and configured to qualify beamforming characteristics of the device under test based on RF signals exchanged between the measurement application device and the device under test via the at least one measurement application antenna and the RIS reflector. Further, the present disclosure provides a respective test method.