RIS Reflection Analysis Using Ray-Traced Incident Angles
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Solution Overview
Problem
Analyzing reflection characteristics of a reconfigurable intelligent surface is time-consuming due to the need for electromagnetic field analysis at multiple incident angles, which prolongs calculation time without ensuring accuracy.
Innovation Solution
A reflection characteristic analysis device that calculates incident angles using a ray-tracing method followed by electromagnetic field analysis at selected angles, reducing the need for comprehensive electromagnetic field analysis across all directions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electromagnetic field analysis is performed for all incident angles in all directions, then analysis accuracy is improved, but calculation time increases enormously
Solution Approach 1:
The ray-tracing method is performed first to pre-calculate incident angles before conducting electromagnetic field analysis. This preliminary action identifies which incident angles actually occur in the propagation environment, allowing the subsequent electromagnetic field analysis to focus only on these specific angles rather than all possible angles, thereby reducing calculation time while maintaining accuracy
Solution Approach 2:
The patent extracts only the necessary incident angles that actually occur in the propagation path using ray-tracing, rather than performing electromagnetic field analysis for all possible incident angles. This extraction of relevant data reduces the scope of electromagnetic field analysis to only those angles that contribute to the actual propagation characteristics
2Productivity
If ray-tracing method is used alone, then calculation speed is improved, but analysis accuracy deteriorates due to inability to consider absorption in non-normal reflection directions
Solution Approach 1:
The patent merges the ray-tracing method with electromagnetic field analysis in a sequential hybrid approach. Ray-tracing provides the incident angle information quickly, and electromagnetic field analysis is then applied specifically to these angles to calculate accurate reflection characteristics including absorption effects in non-normal directions, combining the speed advantage of ray-tracing with the accuracy of electromagnetic field analysis
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Reduces calculation time significantly while maintaining analysis accuracy by focusing electromagnetic field analysis on pre-calculated incident angles, thereby optimizing the analysis process.
Implementation Method 1
a ray trace calculation unit configured to calculate an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method
Implementation Method 2
an electromagnetic field analysis unit configured to acquire the incident angle calculated by the ray trace calculation unit, and to calculate, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle
Data Source
AI summary
A reflection characteristic analysis device analyzes reflection characteristics of a reconfigurable intelligent surface (RIS: Reconfigurable Intelligent Surface). The reflection characteristic analysis device includes a ray trace calculation unit and an electromagnetic field analysis unit. The ray trace calculation unit calculates an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method. The electromagnetic field analysis unit acquires the incident angle calculated by the ray trace calculation unit, and calculates, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle.