Robot Arm Optical Teaching for Precise Substrate Transfer
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Solution Overview
Problem
Current robot arm teaching methods in semiconductor manufacturing lack precision, particularly in detecting rotation angles and specifying the position of rotation axes, which is crucial for high-precision substrate transfer in complex processing systems.
Innovation Solution
A transfer device equipped with a robot arm, a light irradiation unit, and a control device that uses light detection to determine rotation angles and specify the position of the rotation axis by analyzing changes in light reception, allowing for precise teaching of the robot arm's movements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional teaching methods are used for robot arm, then the teaching process can be completed, but the precision of rotation angle detection and rotation axis position specification is insufficient
Solution Approach 1:
The patent replaces conventional mechanical teaching methods with an optical detection system. A light source emits light that passes through or is blocked by the robot arm, and a light receiving unit detects the light intensity changes. This optical system substitutes for traditional mechanical encoders and sensors, enabling non-contact, high-precision measurement of rotation angles and arm position without mechanical wear or calibration errors.
Solution Approach 2:
The patent introduces light as an intermediary medium between the robot arm and the detection system. The light serves as a mediator that carries information about the arm's position and orientation without direct physical contact. By detecting light intensity variations caused by the arm blocking or transmitting light, the system indirectly measures rotation angles and axis positions with high precision.
2Manufacturing precision
If light detection method is used to detect rotation angle and specify rotation axis position, then teaching precision is improved, but the device complexity increases
Solution Approach 1:
The patent designs the light source and light receiving unit to serve multiple functions simultaneously. The same optical system is used for detecting rotation angles, specifying rotation axis positions, and verifying arm orientation during the teaching process. This multi-functional approach eliminates the need for separate sensors and measurement devices, reducing overall system complexity while maintaining high precision.
Solution Approach 2:
The robot arm itself serves as part of the detection system by blocking or transmitting light based on its own position. The arm's physical presence and orientation directly modulate the light signal, meaning the object being measured also contributes to the measurement process. This self-service approach eliminates the need for external calibration artifacts or additional measurement infrastructure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-precision teaching of the robot arm, improving the accuracy of substrate transfer and handling in semiconductor manufacturing processes by accurately determining and correcting rotation axis positions.
Implementation Method 1
a process of detecting a first rotation angle of the arm when a state in which the first optical path is not blocked by the arm is changed to a state in which the first optical path is blocked by the arm on the basis of whether the light irradiated from the first light irradiation unit is received by the first light receiving unit
Data Source
AI summary
There is provided a transfer device for transferring a substrate. The transfer device comprises a robot arm having an arm for transferring the substrate and a driving unit for rotating the arm, a first light irradiation unit configured to irradiate light along a first optical path, a first light receiving unit configured to receive the light irradiated from the first light irradiation unit, and a control device configured to control the driving unit so that the arm is rotated across the first optical path.


