Robotic DUT Handling for Mixed-Form-Factor ATE Test Cells
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Solution Overview
Problem
Conventional automated test equipment (ATE) systems face inefficiencies due to the need for manual handling of devices under test (DUTs), which is time-consuming, error-prone, and can damage devices, and the inability to access test environments during testing, leading to idle tester slices and inefficient use of resources.
Innovation Solution
The implementation of modular primitives and DUT interface boards (DIBs) connected to robots that automate the insertion and removal of DUTs of various form factors, using exchangeable grippers and cameras to handle devices without damaging them, and employing dual-fan cooling with ambient air to maintain setpoint temperatures, eliminating the need for environmental chambers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual insertion and removal of DUTs is used, then device handling is simple, but it is time-consuming, error-prone, and can damage devices
Solution Approach 1:
The system uses self-aligning fixture designs where DUTs automatically position themselves during insertion, and the system includes self-diagnostic capabilities that detect and report issues without manual intervention, reducing both handling complexity and improving efficiency
Solution Approach 2:
The patent replaces manual mechanical handling with automated robotic systems equipped with specialized end effectors that can precisely manipulate DUTs, eliminating human error and damage while significantly increasing throughput and productivity
2Stability of the object's composition
If environmental chamber is used to control testing environment, then testing conditions are stable, but the chamber is not accessible during testing and requires expensive equipment
Solution Approach 1:
The patent divides the testing system into modular fixture units that can be independently configured and accessed. Each module maintains its own environmental controls, allowing selective access to specific test stations without disrupting the entire system, thus reducing complexity while maintaining stability
Solution Approach 2:
The fixture design incorporates universal interfaces and standardized mounting mechanisms that allow the same hardware platform to test multiple device types and configurations. This multi-functionality eliminates the need for separate environmental chambers for different test scenarios, reducing overall system complexity and cost
3Measurement precision
If tester slices are dedicated to specific tests, then testing precision is maintained, but idle slices occur when tests are not being run
Solution Approach 1:
The patent implements dynamically reconfigurable fixture configurations where test stations can be programmatically adjusted between different test types. This dynamic adaptability allows the same physical infrastructure to maintain precision for specialized tests while being efficiently reallocated between uses, eliminating idle time and improving resource utilization
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables automated, efficient, and flexible testing of various electronic devices, increasing yield and reducing time, while allowing full utilization of test systems and reducing costs by eliminating the need for expensive environmental chambers.
Implementation Method 1
dual-fan cooling with ambient air to maintain setpoint temperatures
Data Source
AI summary
A system for performing tests using automated test equipment (ATE) is disclosed. The system comprises a robot comprising an end effector operable to pick up and transfer a DUT in-and-out of a test slot in a primitive. The system further comprises a system controller comprising a memory and a processor for controlling the robot. Also, the system comprises a test rack comprising a plurality of primitives, wherein the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of primitives within the test rack using the end effector.