Robotic Probe Assembly Exchange for Automated Test Reconfiguration
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Solution Overview
Problem
Current electrical inspection systems for large-scale electronic devices, such as LCD and OLED displays, require manual reconfiguration of probing structures for different device layouts, leading to extended downtime, increased costs, and safety hazards due to the need for manual intervention in process control chambers.
Innovation Solution
A robotic probe system with a storage rack, probe bar gantry, and automated robot system that can pick and place probe assemblies with customizable contact pins, an electrical bus, and RFID tagging for automated identification and configuration, allowing for remote and automatic reconfiguration of probing structures according to the device under test's layout.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If manual reconfiguration of probing structures is performed for different device layouts, then the inspection system can accommodate various devices, but machine downtime increases and operator safety risks arise
Solution Approach 1:
The probing structure is divided into modular probe assemblies that can be independently selected and exchanged. Each probe assembly is designed as a discrete unit with specific contact pin configurations, allowing rapid replacement without reconfiguring the entire probing system. This segmentation enables quick adaptation to different device layouts while minimizing machine downtime.
Solution Approach 2:
The system employs a universal probe assembly design that can be configured for multiple device types through selective exchange of probe assemblies rather than customizing the entire probing structure. The standardized interface and modular architecture allow a single probing system to handle various LCD and OLED panel configurations, improving versatility without requiring extensive reconfiguration time.
2Adaptability or versatility
If manual reconfiguration is performed in the process control chamber, then probe assembly can be changed, but operator exposure to safety hazards increases
Solution Approach 1:
A robotic manipulation system serves as an intermediary between the operator and the process control chamber. The robot performs probe assembly exchange operations inside the chamber, eliminating direct operator exposure to hazardous environments. The robotic system can be programmed to handle probe assemblies safely, maintaining adaptability while removing safety risks associated with manual intervention.
Solution Approach 2:
The system incorporates automated identification and verification mechanisms that allow probe assemblies to self-configure upon installation. RFID tags or barcodes on probe assemblies enable automatic recognition by the control system, which then automatically updates testing parameters and configurations. This self-service capability reduces the need for manual reconfiguration steps that would require operator presence in the control chamber.
3Adaptability or versatility
If customized probing structures are developed for new panel layouts, then testing capability is expanded, but development costs increase
Solution Approach 1:
The probing structure is segmented into standardized probe assemblies that can be produced using uniform manufacturing processes. By dividing the system into modular units with consistent interfaces and mounting mechanisms, the complexity of manufacturing is reduced. New probe assemblies for different layouts can be manufactured more economically by reusing common components and assembly procedures rather than developing entirely new customized structures.
Solution Approach 2:
A universal base design is implemented for all probe assemblies, with only the contact pin arrangements varying to accommodate different device layouts. This universal platform approach allows the majority of the probing structure to be manufactured once and reused across multiple applications, significantly reducing development costs for new panel layouts while maintaining expanded testing capability.
4Adaptability or versatility
If non-used probe assemblies are stored outside the machine, then space is required, but machine footprint is increased
Solution Approach 1:
Probe assemblies are stored in a compact rack system integrated within the machine footprint. The rack utilizes vertical space and nested arrangements to hold multiple probe assemblies in a space-efficient manner. This nested storage approach provides ready access to various probe assemblies without requiring additional floor space, maintaining adaptability while minimizing the machine's overall footprint.
Solution Approach 2:
The storage system transitions from horizontal floor space to vertical space utilization. Probe assemblies are arranged in vertically oriented racks or stacked configurations within the machine enclosure, effectively using the third dimension (height) to store multiple probe assemblies. This dimensional change allows adequate probe assembly availability without increasing the horizontal footprint of the machine.
Data Source
AI summary
A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.