Rock Sample 3D Model via Selective Binarization
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Solution Overview
Problem
Current X-ray micro- and nano-computed tomography techniques for analyzing rock samples face challenges in segmenting 3D images into distinct phases (grains and pores) due to non-step-like boundaries, requiring destructive thin section preparation for 2D-3D registration, which is not applicable in real-life scenarios as it damages the original sample.
Innovation Solution
A method involving X-ray micro/nanoCT scanning followed by selective binarization techniques, including global, automated, and local thresholding methods, to create a 3D model of rock samples based on image quality and properties, avoiding destructive 2D-3D registration and preserving the original sample.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If 2D-3D image registration is performed to build accurate 3D models, then the precision of the 3D model is improved, but the original sample must be destructed by making thin sections
Solution Approach 1:
The patent creates a digital copy (3D model) of the rock sample's internal structure through X-ray micro/nanoCT scanning, eliminating the need for physical thin section preparation. The digital model serves as a virtual replica that can be analyzed without damaging the original sample.
Solution Approach 2:
The patent replaces the mechanical process of cutting thin sections with a non-contact X-ray imaging system. Instead of physically sectioning the sample to obtain 2D images for registration, the system uses X-ray attenuation differences to directly generate 3D images of the internal structure.
2Measurement precision
If grayscale microCT images are segmented into two phases (grains and pores), then the 3D model accuracy is improved, but the binarization process becomes complex due to non-step-like boundaries
Solution Approach 1:
The patent applies different binarization methods (global thresholding, local thresholding, Otsu's method, adaptive thresholding) that adjust the segmentation parameter (threshold value) based on local image characteristics. This allows accurate phase separation despite the gradual transitions in grayscale values.
Solution Approach 2:
The patent uses local binarization methods where the threshold value varies across different regions of the image based on local statistical properties. This adapts the segmentation criteria to local variations in image quality, pore size distribution, and artifact levels, improving segmentation accuracy in heterogeneous regions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the creation of accurate 3D models of rock samples without damaging them, allowing for non-destructive analysis and improved image segmentation through appropriate binarization methods based on image quality and porosity, facilitating further investigations.
Implementation Method 1
X-ray micro- and nano-computed tomography is a well-known non-destructive technique for visualizing and quantifying the internal structure of objects in three dimensions (3D). The absorption (attenuation) depends on the chemical composition of the material and its physical density.
Data Source
AI summary
A method for building a 3D model of a rock sample comprises performing X-ray micro/nanoCT scanning of a rock sample and obtaining its initial three-dimensional microstructure image in a gray scale. Then, an analysis of the obtained three-dimensional image of the rock sample is performed and a binarization method is selected in dependence of the image quality and properties of the rock sample. The selected binarization method is at least once applied to the obtained initial three-dimensional image of the sample. Obtained 3D binarized image represents a 3D model of the rock sample.