X-ray Scannable Rock Sample Sliver with Peripheral Encapsulation
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Solution Overview
Problem
Current methods for analyzing rock samples, such as well cores, are time-consuming and expensive due to the need for high-resolution scanning of large samples, and machining these samples can be physically damaging, while existing techniques often require stabilizing backings that interfere with x-ray scanning results.
Innovation Solution
A method involving the preparation of unbacked sample-carriers or slivers encased in a hardened polymer encapsulant, allowing for stabilization and handling without interference, enabling efficient x-ray scanning and evaluation by machining the samples into thinner, planar sections without the need for stabilizing backings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If samples are machined down to smaller and thinner dimensions to reduce scanning time and cost, then scanning efficiency is improved, but the physical ability of the sample to tolerate machining forces deteriorates
Solution Approach 1:
The sample is embedded in a support matrix before machining operations begin. This preliminary embedding provides mechanical support that enables the sample to withstand machining forces during the thinning process, allowing the sample to be reduced to the required thin dimensions without disintegrating
Solution Approach 2:
The support matrix acts as an intermediary between the machining tool and the sample. It absorbs and distributes the mechanical stresses and forces applied during machining, protecting the sample from direct damage while enabling the machining process to proceed
2Stability of the object's composition
If a stabilizing backing is attached to the sample before machining to prevent damage, then sample stability during machining is improved, but x-ray scanning accuracy deteriorates due to interference
Solution Approach 1:
The support matrix serves as an intermediary that provides mechanical stability during machining but is designed to be transparent or minimally interfering to x-ray scanning, thus maintaining measurement precision while providing the needed structural support
Solution Approach 2:
The support matrix is positioned only at the periphery and edges of the sample, leaving the central scanning region free of interfering materials. This localized placement provides mechanical support where needed while minimizing interference with x-ray scanning of the sample interior
3Measurement precision
If the entire sample is scanned at high resolution to identify all pores, then measurement precision is improved, but scanning time and cost increase significantly
Solution Approach 1:
The sample is reduced to a thin section that can be scanned more quickly, and the scanning process itself is segmented into lower-resolution preliminary scanning followed by targeted high-resolution scanning of specific regions of interest, thereby reducing overall scanning time while maintaining the ability to identify pores when needed
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach facilitates faster and more accurate x-ray scanning of rock samples by stabilizing them without backings, reducing physical damage during machining and improving the accuracy of digital image analysis, allowing for better selection of sample regions for further analysis.
Implementation Method 1
encapsulating the cut sample to encapsulate at least a peripheral edge that extends around the sample and that is located between the opposite sides thereof
Data Source
AI summary
A method is provided to allow characterization of rock or other types of samples using a sliver that is prepared to have a sample and optionally a plurality of thin discrete reference objects encapsulated by hardened encapsulant that surrounds the peripheral edges of the sample and any reference objects. Systems for performing the methods are also provided. An x-ray scannable sliver also is provided as a single unit that has a thin discrete sample and a plurality of thin discrete reference objects encapsulated by hardened encapsulant that encases the peripheral edges of the sample and reference objects.