Rolling Contactor for Semiconductor Test UPH

The patent transforms the static vertical movement mechanism into a dynamic rotational system. The contactor rotates to bring test pins into contact with semiconductor devices, replacing the traditional vertical chuck movement. This dynamic approach allows continuous rotation and contact establishment without the need for repeated vertical positioning, significantly reducing index time while maintaining contact precision through controlled rotational movement.

The patent substitutes the vertical mechanical movement system with a rotational mechanical system. Instead of moving the chuck vertically to establish contact, a contactor rotates horizontally to bring test pins into contact with devices. This substitution changes the fundamental mechanical approach from linear vertical motion to rotational horizontal motion, reducing the complexity and time of index operations.

The patent divides the handling system into multiple independent contactors, each capable of rotating and contacting devices independently. Instead of one heavy mechanism handling all devices, multiple lighter contactors work in parallel. Each contactor manages a subset of devices, reducing the weight and inertia of individual handling mechanisms while maintaining high overall test capacity through parallel operation.

The patent introduces rotational dynamics to the handling mechanism, allowing contactors to rotate and engage devices continuously. This dynamic rotational approach replaces slow linear movement with faster rotational motion, enabling the handling mechanism to service multiple devices in sequence without the heavy acceleration and deceleration cycles required by vertical movement systems.