Electron Microscope Aberration Correction Using Ronchigram Transformers

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Solution Overview

Problem

The manual tuning of electron-beam lenses in electron microscopes for aberration correction is tedious, time-consuming, and often non-optimal due to drifting processes, necessitating frequent adjustments.

Innovation Solution

An electronic controller employing a transformer with an autoregressive masked language model automatically corrects geometric aberrations in electron-beam optics using Ronchigram acquisition circuitry, guided by a trained alignment process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual tuning of electron-beam lenses is performed, then aberration correction can be achieved, but the process becomes tedious and time-consuming

Engineering Contradiction:
Improveaberration correction accuracyVSAvoidtuning time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system uses an automated transformer model that independently performs aberration correction without human intervention. The model receives Ronchigram images, processes them through the trained neural network, and automatically determines optimal lens alignment parameters, enabling the system to self-correct aberrations without manual tuning

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces the manual mechanical adjustment process with an automated computational system. The transformer model, trained on reference Ronchigrams, substitutes human operators by automatically analyzing diffraction patterns and computing correction parameters through neural network inference

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If manual tuning is performed frequently to offset drifting processes, then alignment accuracy is maintained, but productivity decreases

Engineering Contradiction:
Improvealignment stabilityVSAvoidmeasurement efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system implements continuous feedback by repeatedly acquiring Ronchigram images and processing them through the transformer model. The model compares current Ronchigrams against the trained reference corpus, detects drift conditions, and automatically adjusts alignment parameters to maintain optimal performance without manual intervention

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The automated system enables continuous aberration correction operations without interruption. The transformer model can process Ronchigrams in real-time, maintaining continuous monitoring and adjustment of lens alignment, eliminating the discontinuous nature of manual retuning sessions

Inventive Principle:
Principle #20Continuity of useful action

3Measurement precision

If manual tuning is performed, then aberration correction is achieved, but the results are often non-optimal

Engineering Contradiction:
Improvealignment accuracyVSAvoidoperation complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The transformer model is pre-trained on a comprehensive corpus of reference Ronchigrams that span the alignment parameter space. This preliminary training phase captures optimal correction strategies, enabling the model to rapidly determine best corrections for new Ronchigrams without requiring operators to understand complex alignment procedures

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12531204B2Microscope aberration correction
Publication Date: 2026.01.20 FEI CO
  • US12531204B2 patent drawing
  • US12531204B2 patent drawing
  • US12531204B2 patent drawing

AI summary

Disclosed herein are scientific-instrument support systems, as well as related methods, apparatus, computing devices, and computer-readable media. In some embodiments, a support apparatus for a scientific instrument includes an interface device and a processing device. The interface device receives Ronchigrams acquired with the scientific instrument and transmits control signals for the electron-beam optics thereof. The processing device converts a measured Ronchigram into an input token for a transformer, produces an output token based on a tokenized sentence ending with the input token, and determines adjustments to the control signals based on the input and output tokens. The input and output tokens belong to a plurality of tokens representing reference Ronchigrams sampling an alignment parameter space of the electron-beam optics. The transformer implements an autoregressive masked language model trained on a corpus of reference sentences representing paths through the alignment parameter space to a target alignment state of the electron-beam optics.