Rotatable Probing Apparatus for Double-Sided PCB Testing
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Solution Overview
Problem
The challenge lies in effectively testing double-layer printed circuit boards with complex layouts, as existing methods struggle to efficiently probe and test both sides of these boards, particularly for high-frequency measurements.
Innovation Solution
A probing apparatus comprising a frame, a testing device, a rotatable testing platform, and a probe module, allowing for displacement along the X and Y directions and rotation around the X axis, enabling double-sided testing with the testing device positioned for optimal signal line configuration and frequency testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a conventional single-sided testing method is used, then the testing device structure is simple, but it cannot efficiently test both sides of double-layer PCBs
Solution Approach 1:
The patent introduces a rotatable testing platform that can rotate 180 degrees around the X-axis, transitioning from a single-sided testing configuration to a double-sided testing configuration. This dimensional change allows the probe module to access both the upper and lower surfaces of the PCB, enabling simultaneous testing of both sides without requiring multiple separate testing devices, thus improving productivity while maintaining reasonable device complexity.
Solution Approach 2:
The testing platform is designed with rotational capability around the X-axis, allowing it to dynamically change its orientation between horizontal (single-sided testing) and vertical (double-sided testing) positions. This dynamic adjustment enables the system to adapt to different testing requirements, allowing efficient double-sided testing when needed while maintaining operational flexibility.
2Reliability
If the testing device is positioned far from the object to be tested, then the device can accommodate various test configurations, but the signal line length increases affecting high-frequency testing
Solution Approach 1:
The patent positions the probe module and testing device at optimal locations relative to the rotatable platform, ensuring that the signal line length remains minimized when the platform is in the testing position. The probe module is specifically configured to approach the PCB from the direction that provides the shortest signal path, thereby ensuring signal integrity for high-frequency testing while maintaining the adaptability of the overall system through the rotatable platform design.
3Productivity
If both sides of the PCB are tested simultaneously, then testing efficiency improves, but the device structure becomes more complex
Solution Approach 1:
The rotatable testing platform serves multiple functions: it can be positioned horizontally for single-sided testing, rotated to vertical position for double-sided testing, and adjusted to accommodate different PCB sizes and configurations. By making the platform multi-functional, the system achieves simultaneous double-sided testing capability without requiring separate dedicated devices for each function, thereby improving productivity while limiting the increase in device complexity through versatile design.
Data Source
AI summary
A probing apparatus includes a frame, a testing device, a rotatable testing platform, and a probe module. The testing device is disposed on the frame and is displaceable along an X direction and a Y direction perpendicular to the X direction. The rotatable testing platform is disposed on the frame and is rotatable around a rotating axis extending in the X direction. A direction perpendicular to the X direction and the Y direction is a Z direction, and the rotatable testing platform and the testing device are located at different positions of the Z direction. The probe module is disposed on the rotatable testing platform.