Rotatable Shield for X-ray Diffractometer Low-Angle Noise
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Solution Overview
Problem
Existing X-ray diffractometers face increased background noise when measuring scattered beams at low angles due to the divergent X-ray beam directly hitting the detector, which interferes with the detection of scattered beams from the sample.
Innovation Solution
Incorporating a rotatable shield arranged around a third rotation point, fixed relative to the detector, that shields the detector from the divergent X-ray beam while allowing scattered beams from the sample to reach the detector, and utilizing an orientation mechanism to ensure the shield does not obstruct the scattered beams, even at varying angles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the detector is positioned to detect scattered beams at low scattering angles, then the detection capability for low-angle scattered beams is improved, but the divergent X-ray beam directly hits the detector causing increased background noise
Solution Approach 1:
A shield is introduced as an intermediary element between the X-ray source and the detector. The shield selectively blocks the divergent direct X-ray beam from reaching the detector while allowing scattered beams from the sample to reach the detector, thus reducing background noise without compromising detection capability
2Object-affected harmful factors
If a shield is added to block the divergent X-ray beam from the detector, then background noise is reduced, but the shield may obstruct scattered beams from the sample
Solution Approach 1:
The shield is made rotatable around a third rotation point, allowing its angular position to be dynamically adjusted. This enables the shield to adapt its orientation to block direct X-ray beams at various angles while maintaining openings or adjusting positions to allow scattered beams from the sample to reach the detector without obstruction
3Adaptability or versatility
If the angle between the X-ray beam and sample surface is varied to measure more scattered beams, then the measurement coverage is improved, but the system complexity increases due to multiple rotating components
Solution Approach 1:
The shield is designed to serve multiple functions simultaneously: it blocks direct divergent X-ray beams from reaching the detector, allows scattered beams from the sample to reach the detector, and can be rotated to adapt to different measurement angles. This multi-functionality reduces the need for additional separate components
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively reduces unwanted background noise by preventing the divergent X-ray beam from hitting the detector, allowing for accurate measurement of scattered beams across a range of angles without obstructing the sample's radiation.
Implementation Method 1
the shield is configured and arranged to shield the detector from the divergent X-ray beam coming from the X-ray source but not obstructing the scattered beams coming from the sample
Implementation Method 2
An X-ray source emits a divergent X-ray beam that irradiates the surface of a sample under investigation. By X-ray diffraction this beam is scattered in directions obeying Braggs law.
Implementation Method 3
By X-ray diffraction this beam is scattered in directions obeying Braggs law
Data Source
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AI summary
An X-ray diffractometer is provided comprising a first arm (8) and a second arm (9), the first arm being rotatably connected to the second arm at a first rotation point (10). A sample holder (14) is mounted onto the first arm at an outer end of the first arm away from the first rotation point (10). An X-ray source (2) is configured to emit a divergent X- ray beam (50) so as to irradiate a surface of the sample (5). The second arm is rotatably connected to the X-ray source (2) at a second rotation point (11). A detector (7) is configured to detect scattered beams coming from the sample, the detector being rotatably arranged around the first rotation point. Guiding means (12, 13) are provided to guide the sample (5) along a main axis of the X-ray beam thereby varying an angle between the first and second arm. The connection between the first and second arm forces the sample holder (14) to rotate relative to the main axis of the X-ray beam so that an angle between the main axis of the X-ray beam and the surface of the sample is varied. A special shield is provided that is arranged to shield the detector from the divergent X-ray beam coming from the X-ray source but not obstructing the scattered beams coming from the sample (5) so as to allow the scattered beams to reach the detector (7).