Rotatable Test Board Layout for PCIe SSD Signal Integrity
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Solution Overview
Problem
The challenge of testing storage devices like SSDs for signal integrity in various lane lengths due to the adoption of PCIe 6.0's PAM-4 method, where signal integrity varies with data signal levels, is not adequately addressed by existing technologies.
Innovation Solution
A test device and system with a rotatable test board and rack design, featuring ports on different side surfaces connected to lanes of varying lengths, allowing sequential testing across multiple orientations to assess signal integrity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a storage device is connected to lanes of various lengths for signal integrity testing, then the testing comprehensiveness is improved, but the device complexity increases
Solution Approach 1:
The test board is made rotatable relative to the supporter, allowing dynamic reconfiguration of lane connections. The rotator enables the test board to rotate between initial and rotated positions, dynamically changing which ports connect to which lanes of various lengths, thus achieving comprehensive signal integrity testing without requiring multiple fixed test boards
Solution Approach 2:
A single test board with multiple ports disposed on different side surfaces serves multiple testing functions. By rotating the test board to different orientations, the same physical ports can be connected to different lanes of various lengths, making the test board universal for testing storage devices under different lane length conditions
2Adaptability or versatility
If ports are disposed on different side surfaces of the test board to enable sequential testing, then the adaptability is improved, but the manufacturing precision requirements increase
Solution Approach 1:
Rather than requiring precise fixed positioning of ports on different side surfaces, the system uses dynamic rotation to achieve proper alignment. The rotator mechanism compensates for manufacturing tolerances by allowing the test board to be rotated to precise angular positions, where the ports align with the appropriate lanes during the testing process
Data Source
AI summary
Provided is a test device including a supporter, a test board on the supporter, the test board including a central processing unit (CPU) and a plurality of ports connected to the CPU through a plurality of lanes respectively on different side surfaces of the test board and having different lengths, and a rotator between the supporter and the test board, the rotator being configured to rotate the test board with respect to a rotation axis perpendicular to an upper surface of the test board.