Rotating Arm Probe for Leaking Ray Testing
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Solution Overview
Problem
Current methods for testing leaking rays in ray machines, such as those used in CT scanners, are costly and inefficient, requiring multiple probes and complex setups to measure a full spherical surface, which increases maintenance and purchase costs.
Innovation Solution
A device and method utilizing a single probe that moves in a controlled manner along latitudinal and longitudinal dimensions to form hemispherical surfaces, allowing for the measurement of leaking rays at multiple positions, which are then combined to cover a full spherical surface, reducing the number of required measurements and improving testing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple probes and complex setups are used to measure leaking rays on a full spherical surface, then measurement completeness is improved, but device complexity and cost increase
Solution Approach 1:
The patent divides the measurement task into two segments: measuring one hemisphere with a single probe, then flipping the ray source component to measure the other hemisphere. This segmentation allows complete spherical coverage using only one probe rather than multiple probes simultaneously, reducing device complexity while maintaining measurement completeness
Solution Approach 2:
Instead of keeping multiple probes stationary to cover different directions, the patent inverts the approach by using a single probe and inverting (flipping) the ray source component to change the measurement orientation. This allows the same probe to measure different hemispheres at different times, reducing the number of probes needed from multiple to one
2Area of stationary object
If multiple probes are used to cover the full spherical surface, then measurement coverage is improved, but purchase and maintenance costs increase
Solution Approach 1:
The patent introduces dynamic movement to the single probe through the rotating arm mechanism, allowing it to dynamically position itself at different locations on the spherical surface. Combined with flipping the ray source component, this dynamic approach enables one probe to cover the entire spherical surface area that would otherwise require multiple stationary probes
Solution Approach 2:
The single probe is designed to be universal and multi-functional, capable of measuring leaking rays from any direction on the spherical surface. By combining the probe's rotational movement with the flipping mechanism of the ray source component, one probe performs the work of multiple probes, reducing purchase and maintenance costs
3Quantity of substance
If a single probe is used to measure multiple positions, then cost is reduced, but measurement time and complexity increase
Solution Approach 1:
The patent implements preliminary action by pre-positioning the probe at optimal measurement points using the rotating arm mechanism before each measurement cycle. The system pre-establishes the measurement geometry and probe positions, so when measurement begins, the probe is already in the correct location, reducing actual measurement time
Solution Approach 2:
The patent ensures continuity of useful action by making the probe's movement and the ray source flipping operation seamless and coordinated. The probe continuously moves to measurement positions while the system transitions between measuring different hemispheres without idle time, maintaining continuous productive measurement action throughout the process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces the cost and complexity of leaking ray tests by enabling a full spherical surface measurement with a single probe, enhancing testing efficiency and controllability while maintaining compliance with regulatory requirements.
Implementation Method 1
a probe mounted on a rotating end of the second rotary arm and configured to measure a numerical value of leaking rays at each position at which the probe stays
Data Source
AI summary
Devices and methods of testing leaking rays are provided. In one aspect, a device includes a first rotary arm configured to rotate around a first rotary axis, a second rotary arm rotatably connected with the first rotary arm and configured to rotate around a second rotary axis, a probe mounted on a rotating end of the second rotary arm and configured to measure a numerical value of leaking rays at each position at which the probe stays, a mounting base rotatably connected with the second rotary arm and configured to mount a ray source component, a first driving unit configured to drive the first rotary arm to rotate around the first rotary axis, and a second driving unit configured to drive the second rotary arm to rotate around the second rotary axis, the first rotary axis being perpendicular to the second rotary axis.