Rotating Probe Card Carrier for Rapid Tool-Free Replacement
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Solution Overview
Problem
Existing testing systems require time-consuming disassembly and reassembly of entire probe cards for replacement or adjustment, affecting efficiency and environmental stability during semiconductor device testing.
Innovation Solution
A testing apparatus with a probe card carrier system that allows for easy and quick replacement of probe cards by rotating the probe card carrier along a guiding and actuating mechanism, eliminating the need to open the housing and reducing tool dependency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the whole probe card is disassembled and reassembled for replacement or repair, then the probe card can be maintained or adjusted, but the process is time-consuming and reduces productivity
Solution Approach 1:
The probe card system is divided into modular components: the probe card carrier (holding assembly) and the probe card itself. This segmentation allows the probe card to be quickly removed and replaced without disassembling the entire testing system, significantly reducing maintenance time while ensuring probe card functionality is maintained through easy replacement of only the necessary component.
2Adaptability or versatility
If the probe card position is adjusted for different DUT types, then the testing system can accommodate various devices, but the whole probe card must be disassembled and reassembled
Solution Approach 1:
The probe card carrier incorporates a movable member that can rotate relative to the mounting base, enabling dynamic adjustment of the probe card's position and orientation. This dynamic mechanism allows quick repositioning for different device under test types without time-consuming disassembly and reassembly operations, maintaining versatility while minimizing adjustment time.
3Reliability
If the probe card is replaced frequently for maintenance or different DUT types, then the testing system remains reliable and adaptable, but the housing must be opened and tools are required
Solution Approach 1:
The probe card carrier is designed with a self-service replacement mechanism where the movable member can be rotated to automatically present the probe card for removal or installation from the first surface. This eliminates the need to open the housing or use additional tools, simplifying the replacement procedure while maintaining testing system reliability through frequent and easy probe card changes.
Data Source
AI summary
The present disclosure provides a testing apparatus, a holding assembly and a probe card carrier. In some embodiments of the present disclosure, the testing apparatus includes a basic circuit board having a first surface and a second surface; a holding assembly disposed on the first surface; a signal transfer assembly disposed on the second surface and electrically connected to the basic circuit board; and a probe card carrier configured to carry a probe card. In some embodiments of the present disclosure, when the probe card carrier is assembled to the holding assembly, the probe card is electrically connected to the signal transfer assembly.