Rotating Probe Screening for Current Transformer Winding Defects
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Solution Overview
Problem
Conventional systems for testing electrical components, particularly circuit breaker sensors, face high inspection failure rates and inconsistency in ground fault detection due to costly and complex manufacturing processes, with issues arising from reworking and scrapping devices only detected at the end of the manufacturing process.
Innovation Solution
A system and method for screening electronic components, including a device under test with a rotation section and probe, where the probe rotates within the device to measure voltage as it passes through a current transformer, allowing for early detection of winding distribution and wrap-around effects, thereby reducing rework and scrapping by identifying faulty components earlier in the process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If individual electronic components are tested only after full device assembly, then the manufacturing process remains simple, but inspection failure rates increase and costly rework is required
Solution Approach 1:
The patent applies preliminary action by testing individual electronic components (sensors, current transformers) before they are assembled into the final device. The testing apparatus includes a test fixture that can independently test components at early stages of manufacturing, allowing defects to be identified and corrected before assembly completion, thereby reducing inspection failure rates and rework costs.
2Ease of operation
If conventional testing systems are used for ground fault detection, then the testing process remains straightforward, but detection consistency deteriorates under high winding asymmetry conditions
Solution Approach 1:
The patent replaces conventional mechanical testing approaches with an enhanced electrical testing system that includes a rotation mechanism to dynamically position conductors relative to the current transformer. This substitution allows for more consistent ground fault detection by systematically varying the magnetic field conditions, thereby improving measurement precision under high winding asymmetry while maintaining operational simplicity through automated control.
3Reliability
If rework and scrapping operations are performed based on end-of-process test failures, then quality control is maintained, but production time and costs increase significantly
Solution Approach 1:
The patent implements preliminary action by conducting comprehensive testing of individual components and assemblies at intermediate stages of manufacturing. The testing apparatus enables early detection of defects in sensors and current transformers, allowing defective units to be identified and corrected before final assembly. This approach maintains quality control while significantly reducing production time by eliminating the need for extensive rework and scrapping operations at the end of the process.
4Reliability
If complex manufacturing and testing processes are used, then component reliability improves, but device complexity and cost increase
Solution Approach 1:
The patent applies segmentation by dividing the testing system into modular components: a test fixture for the current transformer, a rotation mechanism for positioning conductors, and a voltage measurement system. This segmentation allows each component to be tested independently using simplified procedures, achieving high reliability without requiring an overly complex integrated testing system. The modular approach reduces overall device complexity while maintaining comprehensive testing capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach increases reliability and consistency in winding distribution and wrap-around effects screening, reduces costs by identifying faulty components early, and simplifies the testing process, ensuring only components within specified limits are accepted, thereby decreasing production time and waste.
Implementation Method 1
A voltage associated with at least one winding of the current transformer may be measured as the probe rotates within the opening of the device under test
Data Source
AI summary
A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest configured to couple to the device under test and to permit at least a portion of the probe to pass through an opening of the device under test.