Rotating Single-Slit Collimator for X-Ray Position Tracking
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Solution Overview
Problem
Existing X-ray imaging systems face challenges in accurately determining the position of elements equipped with inertial sensors due to errors and low accuracy, particularly in interventional imaging where precise spatial location is crucial during surgical interventions.
Innovation Solution
A simplified X-ray detection system utilizing a single-slit collimator with a rotatable, partially radiotransparent support that generates an X-ray flow, allowing for precise determination of the projected position of detection elements through angular position measurement and processing, and optionally incorporating an optical fork for enhanced accuracy and a pulsed X-ray source with scintillator material for feedback-controlled rotation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a rotating collimator with two slits is used to determine the position of detection elements, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The collimator is divided into multiple independent detection zones, each with its own slit positioned at different angular locations around the rotation axis. This segmentation allows the system to determine positions of multiple detection elements simultaneously or sequentially during rotation, maintaining high measurement precision while using simpler individual slit structures rather than requiring a complex two-slit interference system
Solution Approach 2:
The collimator is designed to rotate dynamically around the X-ray source during image acquisition. This dynamic rotation allows a single slit to sweep through multiple angular positions, enabling the determination of positions for multiple detection elements along the detection axis. The temporal dimension introduced by rotation replaces the spatial complexity of multiple fixed slits with a simpler moving single-slit structure
2Measurement precision
If markers are used to determine system element positions, then measurement precision is improved, but the final image quality deteriorates due to marker traces
Solution Approach 1:
The system extracts the localization function from physical markers that would appear in images and transfers it to the rotating collimator structure. The collimator's slits and rotation mechanism provide the reference framework for determining detection element positions without requiring additional markers in the field of view. This extraction eliminates marker trace interference while preserving spatial localization accuracy through geometric calculation based on slit position and rotation angle
Solution Approach 2:
The rotating collimator acts as an intermediary device that mediates between the X-ray source and detection elements. Instead of using markers that directly appear in images, the collimator provides a mechanical reference system through its rotation and slit positioning. The interaction between the rotating slit and X-ray beams creates angular position information that can be calculated without introducing visible artifacts into the final images
3Device complexity
If inertial sensors are arranged on system elements to determine position, then device complexity is reduced, but measurement precision deteriorates due to error accumulation
Solution Approach 1:
The system replaces inertial sensors with a mechanical reference system consisting of the rotating collimator with precisely positioned slits. Instead of relying on electronic sensors that accumulate errors, the solution uses mechanical geometry—the known positions of slits on the rotating collimator and the measured rotation angles—to determine detection element positions. This mechanical substitution eliminates sensor drift and error accumulation while providing higher measurement precision through geometric calculation
Solution Approach 2:
The system changes the measurement parameters from direct sensor readings to angular position measurements. By measuring the angles at which X-ray beams pass through the rotating collimator slits and intersect with detection elements, the system determines positions through trigonometric relationships rather than direct sensor output. This parameter change from sensor-based to geometry-based measurement eliminates the error accumulation inherent in inertial sensors
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves accurate and reliable spatial localization of detection elements with high precision, enabling real-time three-dimensional tracking of tools during medical procedures while reducing radiation exposure and improving image quality.
Implementation Method 1
a collimator comprising a substantially planar support made of a material with partial or zero radiotransparency... the support being provided on the first face with a single slit which is completely transparent to X-rays
Implementation Method 2
The support is made of an X-ray scintillator material, configured to emit scintillation photons when the support is exposed to the X-ray source
Data Source
AI summary
Collimation device for an X-ray detection system, the collimation device comprising: a collimator comprising a substantially planar support made of a material with partial or zero radiotransparency, the support being rotatably movable about an axis of rotation (Δ) which passes through the support and which is perpendicular to a first face of the support which acts as an X-ray plane of incidence referred to as the main plane of the support (P), the support (D) being provided on the first face with a slit which is completely transparent to X-rays and which is configured to generate an X-ray flow when the collimator is exposed to an X-ray source, the slit extending longitudinally in the main plane of the support along an axis located at a non-zero distance (d) from the axis of rotation (Δ), the slit extending through the entire thickness of the support.