Rotating Test Tray Insert for Side-Terminal Semiconductor Packages
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Solution Overview
Problem
Conventional test trays are inadequate for efficiently testing semiconductor products with terminals located on lateral sides, as they do not expose these terminals properly for connection to sockets during application tests.
Innovation Solution
A test tray system with adjustable inserts that accommodate semiconductor products, allowing terminals on lateral sides to be exposed either upward or downward, featuring a rotary body with a push body and elastic members for posture adjustment and secure mounting.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional inserts are used to accommodate semiconductor products, then the structure is simple and easy to manufacture, but the terminals on lateral sides cannot be exposed properly for socket connection
Solution Approach 1:
The insert includes a rotary body that can rotate between a first posture (transport position) and a second posture (test position), allowing the accommodating portion to dynamically change its orientation. This enables the terminals on lateral sides to be exposed properly for socket connection during testing while maintaining simple structure during transport.
Solution Approach 2:
The insert is divided into separate functional components: a mounting portion for attachment to the tray, a rotary body for posture adjustment, and an accommodating portion for holding the semiconductor product. This segmentation allows each component to perform its specific function independently, solving the contradiction between structural simplicity and operational capability.
2Ease of operation
If the insert structure is made complex to expose lateral terminals, then terminal exposure is improved, but the ease of manufacture deteriorates
Solution Approach 1:
By implementing a rotary body that can rotate between postures, the insert achieves proper terminal exposure without requiring complex fixed structures. The rotational mechanism is relatively simple to manufacture compared to designing entirely new insert structures for different terminal configurations.
Solution Approach 2:
The rotary body mechanism serves multiple functions: it enables the insert to transition between transport and test postures, exposes lateral terminals during testing, and maintains structural integrity throughout the cycle. This multi-functionality reduces the need for multiple specialized inserts, simplifying manufacturing.
3Adaptability or versatility
If a fixed insert configuration is used, then the device complexity is low, but the adaptability to different semiconductor product configurations is limited
Solution Approach 1:
The rotary body enables the insert to adapt to different semiconductor product configurations by rotating between a first posture for transport and a second posture for testing. This dynamic adjustment provides versatility without requiring multiple fixed insert designs, maintaining relatively low device complexity.
Solution Approach 2:
The insert changes its operational parameters (orientation and posture) through the rotary body mechanism. This parameter change allows the same insert structure to accommodate different semiconductor product types and terminal configurations, enhancing adaptability without proportionally increasing complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient testing of semiconductor products with terminals on lateral sides by ensuring proper exposure for socket connection, enhancing test efficiency and compatibility with existing test apparatuses.
Implementation Method 1
a restoring member that provides a restoring force to return the rotary body to an initial posture
Data Source
AI summary
A test tray for testing a semiconductor product according to an embodiment of the disclosure may include a tray and an insert comprising an accommodating portion configured to accommodate the semiconductor product and inserted into the tray. The accommodating portion may have a first posture at a first angle to the tray to accommodate the semiconductor product, and a second posture at a second angle to the tray to test the semiconductor product.