Rotating X-Ray Pallet Inspection for Wide-Angle 3D Scanning
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Solution Overview
Problem
Existing inspection methods for aviation pallet cargo face challenges such as image overlap, limited scanning angles, low pass rates, high labor costs, and high manufacturing costs, especially when using single-view or dual-view X-ray systems, multi-view X-ray systems, and CT scanning systems, which struggle with large-sized pallets and stacked cargo.
Innovation Solution
An inspection system with rotatable and liftable X-ray sources and detector assemblies relative to a carrying device, allowing for combined scanning angles greater than 180 degrees, synchronized rotation and lifting, and adaptive height adjustment based on pallet thickness, forming a dynamic-static scanning method to generate high-quality three-dimensional images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single-view or dual-view X-ray system is used for inspection, then the device complexity is reduced, but the measurement precision and detection accuracy deteriorate due to image overlap and limited scanning angles
Solution Approach 1:
The X-ray source is divided into multiple target spots (first target spot and second target spot) that can be independently activated. This segmentation allows the system to acquire images from multiple angles sequentially, improving detection accuracy without requiring multiple complete X-ray source assemblies, thus maintaining relatively low system complexity.
Solution Approach 2:
The system employs a rotatable component that can switch between different scanning positions (first scanning position and second scanning position). This dynamic positioning capability enables the same physical hardware to achieve multi-angle scanning, improving measurement precision while avoiding the need for multiple static X-ray sources that would increase device complexity.
2Measurement precision
If the X-ray source rotates to multiple scanning positions to increase scanning angle, then the measurement precision improves, but the inspection time increases
Solution Approach 1:
The system performs periodic switching between the first target spot and second target spot at different scanning positions. This periodic activation pattern allows efficient data acquisition from multiple angles without requiring continuous rotation or prolonged inspection, thus improving scanning coverage while minimizing inspection time.
Solution Approach 2:
The rotatable component and detector assembly maintain continuous relative movement during the inspection process. The system continuously acquires X-ray data from different angles through coordinated rotation and target spot switching, ensuring useful action continues throughout the inspection without idle periods, thereby reducing total inspection time while achieving comprehensive scanning coverage.
3Measurement precision
If the ray source is lifted or lowered continuously during rotation, then the scanning coverage is improved, but the device complexity and control difficulty increase
Solution Approach 1:
The lifting and lowering actions are segmented into discrete steps corresponding to specific scanning positions rather than continuous movement. The ray source is lifted or lowered to predetermined positions (first scanning position, second scanning position) where inspection occurs, reducing the complexity of continuous coordination mechanisms while maintaining comprehensive scanning coverage.
Solution Approach 2:
The system pre-positions the ray source at specific scanning positions before performing inspection operations. The lifting or lowering to scanning positions is performed in advance of the actual X-ray acquisition at each position, allowing the coordination mechanism to work with discrete, predetermined positions rather than requiring complex real-time continuous coordination during rotation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively reduces image overlap, improves detection accuracy for prohibited items, enhances scanning efficiency, and lowers costs by using distributed ray sources and detector assemblies, ensuring comprehensive inspection of large aviation pallets with minimal hardware complexity.
Implementation Method 1
at least one ray source configured to emit X-rays
Implementation Method 2
detector assembly configured to receive X-rays emitted from the at least one ray source and passing through the inspection region
Data Source
AI summary
Provided are an inspection system and an inspection method, the inspection system includes: a carrying device (300); at least one ray source (100) each includes a separate housing (110) to define a vacuum space and target spots enclosed within the housing (110), and a detector assembly (200). The at least one ray source (100) is rotatable between a plurality of scanning positions around a rotation axis relative to the carrying device (300). The at least one ray source (100) and the detector assembly (200) may be lifted or lowered along the rotation axis relative to the carrying device (300). When the at least one ray source (100) is located at one of scanning positions relative to the carrying device (300), the at least one ray source (100) and the detector assembly (200) are lifted or lowered along the rotation axis relative to the carrying device (300) and the at least one ray source (100) emits X-rays. After the at least one ray source (100) and the detector assembly (200) are lifted or lowered a predetermined distance relative to the carrying device (300), the at least one ray source (100) rotates around the rotation axis relative to the carrying device (300) to another one of scanning positions.