Roughness Probe with Segmented Skid and Tip
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Solution Overview
Problem
Existing roughness measuring devices, particularly skid sensors, often produce inaccurate results due to the superimposition of skid movement on probe tip movement, leading to incorrect surface profile recordings, especially on periodic surfaces and deep grooves or isolated peaks, and require complex alignments and recalibrations.
Innovation Solution
A device with a stylus having a stylus-sliding element and a probe tip, where the stylus-sliding element is moved over the surface to record 1D, 2D, or 3D signals, and the probe tip records additional signals, allowing for precise alignment and exclusion of errors by calculating deviations from an ideal straight reference system, enabling improved surface roughness measurement without the need for frequent recalibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a skid sensor is used for roughness measurement, then the measurement can be carried out quickly and without major alignments, but the measurement precision deteriorates due to superimposition of skid movement on probe tip movement
Solution Approach 1:
The probe is divided into two independent sensing elements: a skid (15.3) for recording waviness and a probe tip (15.4) for recording surface roughness. Each element has its own sensor, allowing independent measurement of different surface features without mutual interference, thus resolving the contradiction between fast measurement and precise recording.
Solution Approach 2:
The patent introduces an intermediary evaluation system that calculates the difference between skid movement and probe tip movement. This intermediary calculation eliminates the superimposition error by subtracting the skid's macroscopic movement from the probe tip's total movement, thereby recovering the true surface roughness profile.
2Ease of operation
If a skid sensor is used, then ease of operation is improved, but measurement precision deteriorates on periodic surfaces and deep grooves
Solution Approach 1:
By segmenting the sensing function into separate skid and probe tip sensors, the system maintains the ease of operation of skid sensors while adding the precision of reference plane sensors. The skid continues to provide simple, alignment-free operation, while the probe tip provides accurate recording of deep grooves and periodic surface features.
Solution Approach 2:
The system uses feedback from both the skid sensor and probe tip sensor to continuously monitor and compare measurements. The evaluation system processes both signals simultaneously, using the skid's macroscopic movement information to correct the probe tip's measurements, thereby maintaining ease of operation while improving precision on challenging surfaces.
3Measurement precision
If a reference plane button is used, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent merges the skid sensor and reference plane sensor into a single integrated probe structure. The skid (15.3) and probe tip (15.4) are combined in one probe assembly that can be easily attached to the measuring device, achieving reference plane level precision without the full complexity of traditional reference plane buttons. The combined probe maintains a simple, easily changeable structure.
Solution Approach 2:
The integrated probe serves multiple functions: the skid records waviness and macroscopic shape, while the probe tip records surface roughness. This multi-functionality eliminates the need for separate measurement devices, reducing overall system complexity while maintaining high measurement precision across different surface features.
4Productivity
If skid movement is structurally superimposed on probe tip movement, then measurement can be performed, but incorrect results are delivered
Solution Approach 1:
The evaluation system acts as an intermediary that processes both skid and probe tip signals. It calculates the difference between the two signals to eliminate the superimposed skid movement, thereby recovering the true surface profile information that would otherwise be lost in the combined measurement signal.
Solution Approach 2:
The system continuously monitors both skid and probe tip movements and uses feedback from the skid sensor to correct the probe tip sensor readings. This feedback mechanism identifies and compensates for superimposed movements in real-time, preventing incorrect results while maintaining full measurement capability.
Data Source
Figure 1A~2B
Figure 3A~4
Figure 5
AI summary
This concerns a device (10) comprising a roughness touch probe system and a roughness measuring probe, incorporating a sliding element (15.3) and a stylus tip (15.4). The sliding element (15.3) is arranged as a stylus-sliding element (15.3) at one extremal end of a stylus (15.2). The stylus tip (15.4) is integrated into the stylus (15.2), with the distance (A) between the stylus-sliding element (15.3) and the stylus tip (15.4) being predetermined. The roughness touch probe system is a 1D, 2D, or 3D probe system with a parallelogram design. The device further comprises a positioning device that enables the stylus (15.2), together with the stylus slider (15.3) and stylus tip (15.4), to be moved together over a surface (F) to be scanned. A corresponding method for using such a device (10) is also described.