Memory Bus Duty Cycle Tuning With Runtime Flip-Flop Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The challenge in data storage devices, such as SSDs, is the difficulty in dynamically calibrating the clock duty cycle due to environmental changes like temperature and supply voltage, which degrades bus signal characteristics and limits system performance, requiring costly design margins and disruptive calibration processes.
Innovation Solution
A method and apparatus that dynamically monitors and adjusts the clock duty cycle using a measuring circuit with flip flop registers and delay taps, allowing continuous measurement and calibration during operation without stopping the device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the clock signal frequency is increased to improve device performance, then the system performance is improved, but the bus signal characteristics (setup time and hold time) degrade
Solution Approach 1:
The patent adjusts the clock duty cycle parameter to compensate for signal characteristic degradation. By dynamically modifying the duty cycle based on measured setup and hold time margins, the system maintains reliable bus signaling even at higher frequencies where degradation occurs.
Solution Approach 2:
The patent implements a feedback mechanism that continuously measures bus signal characteristics (setup and hold times) and uses this information to adjust the clock duty cycle. This closed-loop control ensures that performance is optimized while maintaining signal integrity margins.
2Productivity
If the clock duty cycle is calibrated at manufacturing to achieve higher performance, then device performance is improved, but design margins must be increased which increases costs
Solution Approach 1:
The patent transitions from static duty cycle calibration at manufacturing to dynamic duty cycle adjustment during operation. The measuring circuit and control logic enable real-time adaptation of the clock duty cycle based on actual bus signal conditions, eliminating the need for excessive design margins.
Solution Approach 2:
The system performs self-calibration by automatically measuring its own bus signal characteristics and adjusting the clock duty cycle without external intervention. This self-service capability reduces the need for conservative design margins while maintaining high performance.
3Measurement precision
If the clock duty cycle is calibrated by stopping device operation to run training sequences, then the clock duty cycle can be measured and adjusted, but the storage device cannot be used until reconfiguration is complete
Solution Approach 1:
The patent enables continuous measurement and adjustment of the clock duty cycle during normal device operation. The measuring circuit operates concurrently with data storage operations, allowing calibration without interrupting service and eliminating downtime associated with traditional training sequences.
Solution Approach 2:
The system performs preliminary measurements of bus signal characteristics during normal operation to predict when duty cycle adjustment will be needed, rather than waiting for performance degradation to occur. This allows proactive optimization without service interruption.
4Manufacturing precision
If manufacturing measurement of clock duty cycle is performed to tune device configurations, then device performance can be optimized, but larger design margins are required which increase costs and lower device performance
Solution Approach 1:
The patent replaces static manufacturing-time calibration with dynamic runtime adjustment. The measuring circuit continuously monitors bus signal characteristics and adjusts the clock duty cycle in response to changing environmental conditions, eliminating the need for large design margins that would be required for static calibration.
Solution Approach 2:
The system dynamically changes the clock duty cycle parameter based on measured bus signal characteristics. This continuous parameter optimization allows precise device configuration tuning without requiring conservative design margins, reducing costs while maintaining high performance.
Data Source
AI summary
A method and apparatus for dynamically monitoring, measuring, and adjusting a clock duty cycle of an operating storage device is disclosed. A storage device includes a measuring circuit comprising a plurality of flip flop registers coupled to a first input line, with each flip flop register having a first input and a second input. One or more delay taps are coupled to each flip flop register, and are disposed on a second input line. While the device operates, a clock signal is input directly into the first input of each flip flop register via the first input line. Simultaneously, the clock signal is input into the second input of each flip flop register through the one or more delay taps via the second input line. The flip flop registers are then read to determine the clock duty cycle of the device, and the clock frequency is adjusted as needed.