Temperature-Dependent S-Matrix Calibration for Impedance Estimation
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Solution Overview
Problem
Existing methods for estimating the impedance of an output load in temperature-sensitive devices are time-consuming and inaccurate due to the need for a vector network analyzer and the variation of the scattering matrix with temperature.
Innovation Solution
An electronic device and method that utilize a calibration kit with a switchable impedance to estimate and calibrate the temperature-related scattering matrix of a temperature-sensitive device under different temperatures without using a vector network analyzer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a vector network analyzer is used to directly probe the front-end device for estimating the S-matrix, then the measurement precision is improved, but the productivity deteriorates due to time-consuming device testing
Solution Approach 1:
The patent uses a calibration kit with known impedance values to create reference measurements that copy the measurement process without requiring a VNA. By measuring the same device under test with different known calibration standards and computing the S-matrix from these measurements, the system achieves accurate S-matrix estimation without the time-consuming VNA probing process
Solution Approach 2:
The patent performs preliminary calibration by measuring the device under test with multiple known impedance values stored in the calibration kit before actual production testing. These preliminary measurements establish reference data that enables rapid S-matrix calculation during mass production without requiring real-time VNA measurements
2Adaptability or versatility
If the temperature is not fixed during measurement, then the adaptability to temperature variation is improved, but the measurement precision deteriorates because the S-matrix varies with temperature
Solution Approach 1:
The patent intentionally changes the temperature parameter by performing calibration measurements at multiple different temperatures. The system stores S-matrix data corresponding to different temperature conditions and selects or interpolates the appropriate S-matrix based on the current device temperature, thereby maintaining measurement precision across temperature variations
Solution Approach 2:
The patent performs preliminary calibration measurements at multiple predetermined temperatures before actual use. These pre-collected temperature-dependent S-matrix data are stored and later used to compensate for temperature effects during production testing, enabling accurate impedance estimation without requiring fixed temperature control during mass production
Data Source
AI summary
An electronic device and a method for calibrating a temperature related scattering matrix (S-matrix) of a temperature sensitive device are provided. The electronic device includes a temperature sensitive device for receiving a forward signal and a reverse signal corresponding to a desired signal and a calibration kit for providing a switchable impedance. During a first phase, the electronic device operates in a first temperature, and multiple first calculation results are calculated according to the forward signal and the reverse signal by setting the switchable impedance to be multiple impedances, respectively. During a second phase, the electronic device operates in a second temperature, and multiple second calculation results are calculated according to the forward signal and the reverse signal by setting the switchable impedance to be the multiple impedances, respectively. In addition, the temperature related S-matrix is calibrated according to the multiple first calculation results and the multiple second calculation results.