S-Parameter Analysis Device for Circuit Constant Extraction
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Solution Overview
Problem
Current methods for analyzing circuit constants of a circuit consisting of a capacitor connected in parallel with a serial connection of a resistor and an inductor face challenges in accurately determining these constants due to limitations in frequency measurement ranges and data processing, particularly with existing S-parameter measurement techniques.
Innovation Solution
The development of an analysis device that uses S-parameters measured by series-through and shunt-through methods, employing equations to convert F-parameters into S-parameters, and extracting pole and zero frequencies from reflection and transmission characteristics to calculate circuit constants without discarding data, thereby accurately determining resistance, inductance, and capacitance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If S-parameters are measured using conventional frequency characteristic measurement devices, then measurement capability is provided, but accurate determination of circuit constants is difficult due to limitations in frequency measurement ranges and data processing
Solution Approach 1:
The patent segments the frequency characteristic data into distinct patterns (first pattern and second pattern) based on the behavior of reflection and transmission characteristics. By dividing the analysis into separate processing paths for different frequency ranges, the system can accurately extract circuit constants without overwhelming complexity in the data processing
Solution Approach 2:
The patent changes the approach by extracting pole frequency and zero point frequency as key parameters from the S-parameter data. This parameter transformation enables accurate circuit constant determination across different frequency ranges, resolving the contradiction between measurement precision and processing complexity
2Measurement precision
If data is processed to determine circuit constants, then analysis is performed, but data loss occurs in existing S-parameter measurement techniques
Solution Approach 1:
The patent recovers and utilizes all available information from both reflection and transmission characteristics. Instead of discarding parts of the data, the system extracts pole and zero frequencies from the complete S-parameter set, ensuring no information is lost and all data contributes to the accurate determination of circuit constants
3Adaptability or versatility
If conventional measurement methods are used, then S-parameters are obtained, but accurate circuit constant analysis is limited by frequency measurement range
Solution Approach 1:
The patent creates a universal analysis method that handles multiple frequency ranges through a single framework. By identifying different patterns in the frequency characteristics and applying appropriate extraction methods for each pattern, the system achieves both broad frequency range coverage and precise circuit constant determination across all ranges
Data Source
AI summary
An analysis device includes an extraction unit configured to use reflection characteristic and transmission characteristic included in S-parameters of a DUT measured by a series-through measurement method with a frequency characteristic measurement device, so as to extract a pole frequency, a zero point frequency, and a low frequency part of gain that can be approximated as a DC component, from gains and phases of the reflection characteristic and the transmission characteristic; and a calculation unit configured to calculate circuit constants of an equivalent circuit of the DUT, from the pole frequency, the zero point frequency, and the low frequency part. The equivalent circuit is a circuit assumed to be consisting of a capacitor connected in parallel with a serial connection body of a resistor and an inductor.