Sacrificial Connectors for IC Probing Without Damage
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Solution Overview
Problem
Integrated circuits face challenges in probing due to probe structures being covered by surface dielectric layers, and electrical connectors on the surface are not suitable for probing without risk of damage.
Innovation Solution
The use of sacrificial connectors, which are specifically designed for probing purposes and are not electrically functional, allowing for the connection status of normal connectors to be determined without damaging them, by forming a stack-probe unit with various connection schemes and configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If probe structures are covered by surface dielectric layer, then electrical insulation is improved, but probing capability deteriorates
Solution Approach 1:
The surface connectors are segmented into two distinct types: normal connectors for electrical connection and sacrificial connectors for probing. This segmentation allows the die to maintain both electrical insulation (through the dielectric layer covering normal connectors) and probing capability (through exposed sacrificial connectors) simultaneously.
Solution Approach 2:
Sacrificial connectors serve as intermediary elements that enable probing without involving the normal electrical connectors. The probe structures contact the sacrificial connectors, which are electrically connected to the normal connectors, thus allowing indirect probing of the electrical connection status without directly contacting the normal connectors.
2Ease of operation
If normal electrical connectors are used for probing, then probing function is achieved, but connector damage risk increases
Solution Approach 1:
Sacrificial connectors are designed as disposable, non-electrically functional elements specifically for probing purposes. These connectors can be damaged during probing without affecting the normal electrical connectors, as they serve only as temporary, sacrificial contact points for probe structures.
Solution Approach 2:
The sacrificial connectors are arranged in correspondence with the normal connectors, creating a duplicate probing interface. This copying allows the probe structures to test the electrical connection status by contacting the sacrificial connectors, which are electrically connected to the normal connectors, without directly contacting the valuable normal connectors.
3Ease of operation
If sacrificial connectors are added to the die surface, then probing capability is improved, but device complexity increases
Solution Approach 1:
The sacrificial connectors and normal connectors are merged into a unified connector structure on the die surface, with both types of connectors sharing the same physical substrate and electrical interconnection system. This merging allows the complex connector configuration to be managed as an integrated system rather than separate components.
Solution Approach 2:
The connector system achieves multi-functionality by having sacrificial connectors handle probing operations while normal connectors handle electrical connections. This universality allows a single connector structure to serve multiple purposes, reducing the need for entirely separate probing and electrical connection systems.
Data Source
AI summary
A package component includes a stack-probe unit, which includes a first-type connector, and a second-type connector connected to the first-type connector. The first-type connector and the second-type connector are exposed through a surface of the package component.