Sacrificial Etch Protection Layers for Epitaxial Lift-Off Substrate Reuse

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Solution Overview

Problem

Existing methods for producing high-efficiency photovoltaic devices face challenges in preserving the integrity of growth substrates for reuse, particularly in transferring active regions from original wafers to host substrates via epitaxial lift-off, while avoiding material loss and maintaining device efficiency.

Innovation Solution

A three-layer protection scheme using slowly etched III-V materials like InAlP, AlGaAs, and InAlGaP is employed to protect the growth substrate during the epitaxial lift-off process, allowing non-destructive removal of epitaxial growth layers and enabling reuse of substrates without the need for polishing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If epitaxial lift-off is used to transfer active regions from original wafers to host substrates, then device efficiency is improved, but growth substrate integrity deteriorates

Engineering Contradiction:
Improvedevice efficiencyVSAvoidgrowth substrate integrity
Core Design Contradiction:
ProductivityVSStability of the object's composition

Solution Approach 1:

Protective layers are deposited on the growth substrate surface before the epitaxial lift-off process to prevent damage during subsequent processing steps. This preliminary protective action allows the substrate to withstand the lift-off process and enables reuse without polishing

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

A sacrificial etch protection layer is introduced as an intermediary between the etchant and the growth substrate. This sacrificial layer absorbs the etching action, protecting the underlying substrate while allowing the lift-off process to proceed. The sacrificial layer is later removed without damaging the substrate

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If substrates are reused after epitaxial lift-off, then manufacturing cost is reduced, but substrate surface quality deteriorates

Engineering Contradiction:
Improvemanufacturing costVSAvoidsubstrate surface quality
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

Protective layers are applied before lift-off to ensure the substrate surface remains intact throughout the process, preserving surface quality for reuse without requiring subsequent polishing operations

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The sacrificial protective layers are designed to be selectively removed after serving their protective function during lift-off. This allows recovery of the intact substrate surface for reuse while discarding only the consumable protective layers

Inventive Principle:
Principle #34Discarding and recovering

3Manufacturing precision

If polishing is used to prepare substrates for reuse, then surface quality is improved, but material loss increases

Engineering Contradiction:
Improvesurface qualityVSAvoidmaterial loss
Core Design Contradiction:
Manufacturing precisionVSLoss of substance

Solution Approach 1:

Protective layers are deposited before lift-off to prevent substrate damage, eliminating the need for subsequent polishing operations and thereby preventing material loss while maintaining surface quality

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The mechanical polishing process is replaced by a chemical protection strategy where sacrificial layers are selectively etched. This substitution avoids the material removal inherent in mechanical polishing while achieving the same protective effect

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively preserves the integrity of growth substrates, maintains device performance, and facilitates the reuse of substrates, as demonstrated by the comparison of regrown and fresh solar cell performance with minimal degradation in photovoltaic parameters.

Implementation Method 1

The protection layers are etched away using, for example, H3PO4: H2O2: H2O (3:1:25) and H3PO4: HCl (1:1), respectively.

Methodology Applied
Scientific EffectChemical etching:

Implementation Method 2

releasing the cell by etching the sacrificial layer with an etchant

Methodology Applied
Scientific EffectChemical etching:

Data Source

PatentEP2727140B1Sacrificial etch protection layers for reuse of wafers after epitaxial lift off
Publication Date: 2019.03.27 THE RGT UNIV OF MICHIGAN
  • EP2727140B1 patent drawingFigure 1
  • EP2727140B1 patent drawingFigure 2
  • EP2727140B1 patent drawingFigure 2

AI summary

There is disclosed a growth structure comprising a growth substrate, a sacrificial layer, a buffer layer, at least three substrate protective layers, at least one epilayer, at least one contact, and a metal or alloy-coated host substrate. In one embodiment, the device further comprises at least three device structure protecting layers. The sacrificial layer may be positioned between the growth substrate and the at least one epilayer, wherein the at least three substrate protective layers are positioned between the growth substrate and the sacrificial layer, and the at least three device structure protecting layers are positioned between the sacrificial layer and the epilayer. There is also disclosed a method of preserving the integrity of a growth substrate by releasing the cell structure by etching the sacrificial layer and the protective layers.