Sample Analyzer Dual Beam Source Phase Change Detection

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Solution Overview

Problem

Current sample analyzers lack the capability to perform real-time measurement of phase change processes in samples using high energy beams effectively.

Innovation Solution

A sample analyzer system that includes a first energy beam source, a second multi-energy beam source, a reflected beam sensor, and a transmitted beam sensor, where the second energy beam is generated using a target and can include ultraviolet, ion, proton, electron, and radiation beams, allowing for simultaneous detection of reflected and transmitted beams during a phase change process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single energy beam source is used to measure the sample, then the device complexity is reduced, but the capability to perform real-time measurement of phase change processes is lost

Engineering Contradiction:
Improvereal-time measurement capabilityVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement system is segmented into multiple independent beam sources, each dedicated to specific measurement functions. The first beam source performs initial sample measurement while the second beam source performs real-time phase change measurement, allowing simultaneous multi-function operation without interference.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The second beam source is designed as a multi-energy beam generator that can produce multiple types of energy beams (ultraviolet, ion, proton, electron, radiation) to interact with the sample during phase change, enabling comprehensive real-time measurement capabilities across different physical interactions.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Loss of information

If multiple sensors are added to detect both reflected and transmitted beams, then the measurement capability is improved, but the device complexity increases

Engineering Contradiction:
Improveinformation completenessVSAvoiddevice complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

Multiple sensors detecting different beam characteristics (reflected and transmitted beams) are merged into a coordinated detection system that simultaneously monitors phase change processes from multiple perspectives, providing comprehensive information without requiring separate independent systems.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The reflected beam sensor and transmitted beam sensor act as intermediaries between the second energy beam and the measurement system, converting complex phase change information into detectable signals that can be processed and analyzed.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Adaptability or versatility

If a multi-energy beam generator is used, then the versatility of measurement is improved, but the ease of operation deteriorates

Engineering Contradiction:
Improvemeasurement versatilityVSAvoidease of operation
Core Design Contradiction:
Adaptability or versatilityVSEase of operation

Solution Approach 1:

The multi-energy beam generator is designed with dynamic beam selection capability, allowing the system to switch between different energy beam types (ultraviolet, ion, proton, electron, radiation) based on the specific measurement requirements, providing versatility while maintaining operational simplicity through automated selection.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables real-time measurement of phase changes in samples by detecting energy beams reflected and transmitted through the sample, providing detailed insights into the phase transformation processes.

Implementation Method 1

a first beam source configured to provide a first energy beam to a sample

Methodology Applied
Scientific EffectLaser heating: Laser

Implementation Method 2

capable of real-time measuring a phase change process of a sample

Methodology Applied
Scientific EffectPhase change: Phase Change

Implementation Method 3

the second energy beam may include an ultraviolet ray

Methodology Applied
Scientific EffectUltraviolet radiation: Radiation

Implementation Method 4

the second energy beam may include an ion particle

Methodology Applied
Scientific EffectIon beam: Ion Beam

Implementation Method 5

the second energy beam may include a proton

Methodology Applied
Scientific EffectProton beam: Ion Beam

Implementation Method 6

the second energy beam may include an electron

Methodology Applied
Scientific EffectElectron beam: Electron Beam

Implementation Method 7

the second energy beam may include a radiation

Methodology Applied
Scientific EffectRadiation: Radiation

Implementation Method 8

a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 9

a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam

Methodology Applied
Scientific EffectTransmission:

Data Source

PatentUS11555779B2Sample analyzer and analyzing method thereof
Publication Date: 2023.01.17 ELECTRONICS & TELECOMM RES INST
  • US11555779B2 patent drawing
  • US11555779B2 patent drawing
  • US11555779B2 patent drawing

AI summary

The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.