Sample Analyzer Multi-Target Test Configuration Through Sub-Hole Mapping
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Solution Overview
Problem
Existing sample analyzers require cumbersome and error-prone configurations for test items when the number of test targets exceeds the number of test channels, leading to inefficient operation and resource wastage.
Innovation Solution
A method for test item configuration that involves acquiring a mapping relationship between test items and sub-holes, configuring test items based on this mapping, and using a control terminal to manage sample analysis, reducing the need for multiple experiment items by allocating test targets to sub-holes within a single experiment item.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple experiment items are created to test multiple targets when the number of test targets exceeds the number of test channels, then all test targets can be tested, but the configuration operation becomes cumbersome and error-prone
Solution Approach 1:
The patent divides the test targets into multiple sub-holes, where each sub-hole can independently hold one or more test targets. This segmentation allows a single experiment item to accommodate multiple test targets without requiring multiple separate experiment items, thereby simplifying the configuration operation while maintaining the ability to test multiple targets simultaneously
Solution Approach 2:
The patent introduces a new dimension of organization by creating sub-holes as intermediate containers between experiment items and test targets. This dimensional change from direct one-to-one mapping to hierarchical mapping (experiment item → sub-hole → test targets) enables more flexible configuration and reduces operational complexity
2Adaptability or versatility
If multiple experiment items are used to test multiple targets, then all test targets can be tested, but resource wastage occurs and experiment time increases
Solution Approach 1:
The patent merges multiple test targets into a single experiment item by using sub-holes as shared containers. Multiple sub-holes within the same experiment item can be filled with different test targets and tested simultaneously in parallel, combining the functionality of multiple separate experiment items into one unified structure, thereby improving experiment efficiency and reducing resource wastage
Solution Approach 2:
The sub-hole structure provides multi-functionality by allowing a single experiment item to serve multiple purposes by accommodating different test targets in different sub-holes. This universal design enables the experiment item to be reused for various testing scenarios without requiring separate dedicated experiment items for each target
3Adaptability or versatility
If traditional configuration methods are used, then test items can be configured, but operational errors increase due to complexity
Solution Approach 1:
By segmenting the configuration into sub-holes with clear one-to-many mapping relationships, the patent reduces the complexity of configuration operations. Each sub-hole can be independently configured with specific test targets, making the configuration process more systematic and less prone to errors compared to managing multiple separate experiment items
Data Source
AI summary
A method for test item configuration, a method for sample analysis and a control terminal are provided. The test item configuration method includes: acquiring a first mapping relationship between a test item and a plurality of sub-holes and test target information of each sub-hole, wherein the test target information includes a test targets in the test channel of the sample analyzer corresponding to each sub-hole, and the test targets corresponding to the plurality of sub-holes are different; and configuring the test item according to the first mapping relationship and the test target information.