Sample Analyzer Test Item Mapping Across Multiple Sub-Holes
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Solution Overview
Problem
Existing sample analyzers require cumbersome and error-prone configuration processes for test items, leading to inefficient use of resources and prolonged experimental times due to the need for multiple experiment items when test targets exceed the number of test channels.
Innovation Solution
A method for configuring test items by establishing a mapping relationship between the test item and multiple sub-holes, allowing a single test item to be configured across multiple sub-holes, thereby reducing the need for multiple experiment items and simplifying the configuration process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple experiment items are created for test targets exceeding the number of test channels, then all test targets can be tested, but the configuration process becomes cumbersome and error-prone
Solution Approach 1:
The patent divides the test item into multiple sub-holes, where each sub-hole can independently configure test targets. This segmentation allows a single test item to handle multiple test targets without creating multiple separate experiment items, thereby simplifying the configuration process while maintaining comprehensive testing capability.
Solution Approach 2:
The patent enables a single test item to serve multiple functions by allowing it to configure and test multiple test targets through its sub-holes. This multi-functionality eliminates the need for duplicate experiment items and reduces configuration complexity while maintaining the ability to test all required targets.
2Adaptability or versatility
If multiple experiment items are used for multiple test targets, then all targets can be tested, but the configuration workload increases
Solution Approach 1:
By segmenting the test item into sub-holes, the patent allows centralized configuration of a single test item that covers multiple test targets. This reduces configuration complexity by consolidating what would otherwise require multiple separate experiment item configurations into one unified structure.
Solution Approach 2:
The patent merges multiple test target configurations into a single test item framework. By combining the configuration of multiple targets under one test item umbrella with shared sub-hole structures, the system reduces overall configuration complexity while maintaining comprehensive testing coverage.
3Adaptability or versatility
If multiple experiment items are created for multiple test targets, then all targets can be tested simultaneously, but the experimental time increases
Solution Approach 1:
The patent merges multiple test targets into a single experiment item structure that can be processed simultaneously. By combining targets within the same test item and utilizing multiple sub-holes for parallel processing, the system achieves comprehensive testing without the time penalty of sequential processing through multiple separate experiment items.
Solution Approach 2:
The segmentation of test items into sub-holes enables parallel processing of multiple test targets within a single experiment item. This allows simultaneous testing of multiple targets without requiring multiple separate experiment items, thereby reducing total experimental time while maintaining full testing capacity.
4Adaptability or versatility
If multiple experiment items are used, then multiple test targets can be tested, but resource utilization efficiency decreases
Solution Approach 1:
The patent implements multi-functionality where a single test item can accommodate and test multiple test targets through its sub-holes. This universal design improves resource utilization efficiency by consolidating resources that would otherwise be duplicated across multiple separate experiment items, while maintaining the capability to test all required targets.
Solution Approach 2:
By merging multiple test targets into a single experiment item framework, the patent reduces redundant resource allocation. The combined structure shares common resources such as reagents, equipment, and processing steps, thereby improving resource utilization efficiency while preserving the ability to test multiple targets comprehensively.
Data Source
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AI summary
The present disclosure relates to a method for test item configuration, a method for sample analysis and a control terminal. The test item configuration method includes: acquiring a first mapping relationship between a test item and a plurality of sub-holes and test target information of each sub-hole, wherein the test target information includes a test targets in the test channel of the sample analyzer corresponding to each sub-hole, and the test targets corresponding to the plurality of sub-holes are different; and configuring the test item according to the first mapping relationship and the test target information. In this way, only one experiment item is configured for the test item, so that the input and modification of homogeneous information of the test item only need to be performed for one experiment item, thereby reducing the workload for configuring the test item and improving the convenience.